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  6. [Observation Case] X-ray Observation of a Toggle Switch

[Observation Case] X-ray Observation of a Toggle Switch

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last updated:Nov 11, 2020

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Observation of the misalignment of the internal metal plate! This is a case study of a toggle switch observed through X-ray fluoroscopy and orthogonal CT observation.

A defective toggle switch component was found where the operating lever does not switch. As a result of X-ray fluoroscopic observation, it was observed that the internal metal plate was misaligned, revealing the cause of the defect. In this case, the metal plate is supposed to move like a seesaw around the central terminal to switch the circuit, but in the defective product, the metal plate is misaligned, preventing the lever from switching to the opposite side and thus making circuit switching impossible. CT observation provides not only 3D images but also arbitrary slice cross-sectional images in the X, Y, and Z directions. [Observation Case] ■ Subject: Toggle Switch ■ Observation Method: X-ray fluoroscopic observation, orthogonal CT observation ■ Cause of Defect: Misalignment of the internal metal plate *For more details, please refer to the PDF document or feel free to contact us.

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[Observation Case] X-ray Observation of a Toggle Switch

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[Observation Case] X-ray Observation of a Toggle Switch

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Case study of switch contact failure analysis

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Since a malfunction was suspected at the switch section of the appliance that would not power on, we will introduce analysis cases along with the work flow. First, we check for any shape changes such as swelling, cracking, or discoloration through visual observation. In the electrical check, we verify whether the malfunction can be reproduced and whether it is an open or short circuit. Internal observation using X-rays revealed that the contact terminals inside the switch had melted, scattered, and disappeared, resulting in an open circuit failure. Ultimately, we will submit a report that includes the consideration of the cause. We also welcome inquiries regarding analysis consultations after non-destructive testing, so please feel free to contact us.

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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.

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