Observation of the misalignment of the internal metal plate! This is a case study of a toggle switch observed through X-ray fluoroscopy and orthogonal CT observation.
A defective toggle switch component was found where the operating lever does not switch. As a result of X-ray fluoroscopic observation, it was observed that the internal metal plate was misaligned, revealing the cause of the defect. In this case, the metal plate is supposed to move like a seesaw around the central terminal to switch the circuit, but in the defective product, the metal plate is misaligned, preventing the lever from switching to the opposite side and thus making circuit switching impossible. CT observation provides not only 3D images but also arbitrary slice cross-sectional images in the X, Y, and Z directions. [Observation Case] ■ Subject: Toggle Switch ■ Observation Method: X-ray fluoroscopic observation, orthogonal CT observation ■ Cause of Defect: Misalignment of the internal metal plate *For more details, please refer to the PDF document or feel free to contact us.
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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.