We provide comprehensive support for reliability testing, analysis, and evaluation of electronic components!
Transitional thermal measurement possible power cycle testing, with a customized luminescence/OBIRCH analysis device, where a skilled team thoroughly evaluates and analyzes power devices!
At Aites, we provide total solution services for power devices, including reliability testing, analysis, and evaluation. We offer services such as the "Power Cycle Tester," which can simultaneously conduct transient thermal measurements, as well as "Failure Analysis of Compound Semiconductors," "Concentration Analysis of Diffusion Layers," and "Cross-Section Analysis of Modules." We will make proposals based on specific achievements. Keywords: ■General Power Semiconductors (chips, module TIM materials, etc.) ■Reliability Testing/Evaluation ■Structural Analysis (Quality, Competitor RE) ■Failure Analysis (Identification of Failure Locations, Cause Investigation, Improvement Proposals) 【List of Tests】 ■Power Cycle Testing ■Liquid Tank Thermal Shock Testing ■Gate Bias Testing ■Non-destructive Observation of Semiconductor/Package Delamination ■Failure Analysis of Power Chips, etc. *For more details, please refer to the PDF document or feel free to contact us.
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Company information
Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.