High-frequency/High-speed transmission design support software

Extracting S-parameter data from the measurement data of the entire mounting fixture is easy!

"In Situ De-embedding (ISD)" is software that allows for the extraction of S-parameter data of the measured object from the measurement data of the entire mounting fixture containing the object, by performing de-embedding with very simple operations. Additionally, during the de-embedding process, the S-parameters are corrected in the time domain, resulting in outcomes that satisfy passivity and causality. 【Features】 ■ Compared to other methods such as the general TRL method, it allows for the extraction of data for the measured object only, in a simple and accurate manner. ■ It can be used for high-frequency components such as capacitors, inductors, resistors, filters, ICs, multi-terminal components like differential devices and high-speed transmission connectors, as well as high-frequency elements measured on-wafer, which are evaluated using S-parameters. *For more details, please download the PDF or feel free to contact us.

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