Light Flash Analyzer for Thermal Diffusivity (Thermal Conductivity) Measurement Device.
The latest tabletop Xe flash analyzer enables rapid, easy, and highly accurate measurement of thermal diffusivity and thermal conductivity. It covers a wide measurement temperature range from -100°C to 1250°C, and with improved pulse width, it can also handle high thermal conductivity samples of thin films that were difficult to measure conventionally. It comes standard with a maximum of 16 auto-sample changers, allowing for highly accurate measurements of samples ranging from large diameters to very small diameters.
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basic information
【Specifications】 ■ Measurement temperature range: -100℃ to 1250℃ ■ Pulse width: 20 to 1200μsec ■ Thermal diffusivity measurement range: 0.01 to 2000 mm²/sec ■ Thermal conductivity measurement range: 0.1 to 4000 W/m*K
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Company information
Netch Japan Co., Ltd. was established in September 2012 as the Japanese subsidiary of Netch, which boasts the world's top market share in thermal analysis and thermal property measurement equipment, by acquiring the business of the Burker brand thermal analysis equipment. With a wide range of products from high-end items to high-performance, low-cost options, we meet the diverse needs of our customers from research and development to quality control.