[Example] Conduction OPEN Monitoring System

Ideal for drop impact testing and more! It monitors the moment of mechanical stress!

- A system that can monitor the moment when the electrical resistance in the conduction path of electronic components increases or becomes open (OPNE) in response to mechanical stress occurring at regular intervals, such as during drop impact tests. - Based on trigger information from shock signals (such as acceleration), resistance value data is collected for a fixed period before and after the trigger for 10 msec at 1 μsec intervals (10,000 points). - By comparing with management standards, an event signal can be generated when the peak resistance value of each channel exceeds the management value. - The stored information can be re-read using the Viewer function, regardless of whether it is during or after data collection. Additionally, results such as peak resistance values can be extracted as text data.

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