Ideal for drop impact testing and more! It monitors the moment of mechanical stress!
- A system that can monitor the moment when the electrical resistance in the conduction path of electronic components increases or becomes open (OPNE) in response to mechanical stress occurring at regular intervals, such as during drop impact tests. - Based on trigger information from shock signals (such as acceleration), resistance value data is collected for a fixed period before and after the trigger for 10 msec at 1 μsec intervals (10,000 points). - By comparing with management standards, an event signal can be generated when the peak resistance value of each channel exceeds the management value. - The stored information can be re-read using the Viewer function, regardless of whether it is during or after data collection. Additionally, results such as peak resistance values can be extracted as text data.
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basic information
【Features】 ○ Resistance value (up to 16 channels) ○ MaxG, MinG, acceleration waveform width (pulse width) ⇒ Analyze and read the data saved in the acceleration waveform management application for integrated management. ○ Statistical information for each item ○ Continuously save data for each item per cycle and resistance waveform data for all channels. ○ Continuation of testing by reading existing data is also possible. ● For more details, please download the catalog.
Price information
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Delivery Time
Applications/Examples of results
[Example of Achievements] ○ Acceleration-related information management application ⇒ Integrated management of acceleration-related parameters on the continuity OPEN check system side.
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Company information
As a development and design company, we promote the development, design, and evaluation of semiconductor peripheral circuits and application products through simulation technology.