I will introduce an example of analysis using an inline thickness gauge.
Managing film thickness not only affects the reliability of the product but also contributes to the reduction of raw materials. The portable fluorescent X-ray analyzer "OURSTEX100FA" can perform film thickness analysis in the manufacturing process of factories. For more details, please contact us or refer to the catalog.
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basic information
**Features** As a result of performance evaluation conducted by installing the fluorescent X-ray thickness gauge developed this time onto a film deposition device: - It was found that errors due to positional fluctuations of the film during transport can be corrected by taking the X-ray intensity ratio with Rayleigh scattering lines. - The detection limits for Cu, Ni, and Cr films were 1.5 nm for Cu, and below 1 nm for both Ni and Cr, demonstrating high sensitivity. - The measurement accuracy, both static and dynamic, was CV = 5% or less, allowing for high-sensitivity measurements of ultra-thin films. - From the above, it is considered that this thickness gauge is sufficiently applicable for inline measurement of ultra-thin film thickness. - Furthermore, it is also believed to be applicable not only for thickness measurement but also for the analysis of plating solutions, etc. For more details, please contact us or refer to the catalog.
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Company information
Awares Tech Co., Ltd. is a specialized manufacturer of energy-dispersive X-ray fluorescence analysis devices. Energy-dispersive X-ray fluorescence analysis devices enable non-destructive and rapid elemental analysis on-site. Currently, they are utilized in various fields such as soil contamination surveys, RoHS directive compliance analysis, concrete salt damage investigations, inline analysis, and archaeological and cultural heritage analysis. Our company specializes in this technology and is dedicated to creating compact, lightweight, and high-performance devices using X-ray elemental technology. We also listen to our customers' needs and collaborate with them to create products tailored to those needs. <Features of our energy-dispersive X-ray fluorescence analysis devices> - No need for liquid nitrogen. - Measurement time is shorter compared to conventional products. - High resolution and high counting rate achieved by adopting semiconductor detector SDD. - Capable of non-destructive measurement of liquids, solids, sols, gels, and more. - Easy to install (only requires AC 100V-5A power supply). - The device is compact. - We are open to consultations regarding special specifications of products. - Our motto is "sincerity and integrity," so please feel free to contact us.