This introduces examples of the analysis of harmful heavy metals Cd and Pb in electronic materials.
In July 2006, the RoHS Directive, which was implemented by the EU (European Union), restricted the use of six specific hazardous substances (lead, cadmium, hexavalent chromium, PBB, PBDE) in electrical and electronic equipment. The fluorescent X-ray analysis device "OURSTEX160RoHS" can analyze these hazardous substances easily, quickly, and with high precision. This time, we would like to introduce the easy analysis of low-concentration Cd and Pb, which are particularly noteworthy, using an energy-dispersive fluorescent X-ray analysis device. For more details, please contact us or refer to the catalog.
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basic information
【Features】 - Compact design that does not require liquid nitrogen or cooling water, resulting in excellent cost performance. - Easy sample handling and simple measurement due to the use of fluorescent X-ray analysis. - High sensitivity for simultaneous analysis of cadmium and lead is achieved using SDD detectors, tungsten anodes, and special filters, enabling short measurement times. - Ideal for trace heavy element analysis in electronic components such as wire coatings and various plastics. For more details, please contact us or refer to the catalog.
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Company information
Awares Tech Co., Ltd. is a specialized manufacturer of energy-dispersive X-ray fluorescence analysis devices. Energy-dispersive X-ray fluorescence analysis devices enable non-destructive and rapid elemental analysis on-site. Currently, they are utilized in various fields such as soil contamination surveys, RoHS directive compliance analysis, concrete salt damage investigations, inline analysis, and archaeological and cultural heritage analysis. Our company specializes in this technology and is dedicated to creating compact, lightweight, and high-performance devices using X-ray elemental technology. We also listen to our customers' needs and collaborate with them to create products tailored to those needs. <Features of our energy-dispersive X-ray fluorescence analysis devices> - No need for liquid nitrogen. - Measurement time is shorter compared to conventional products. - High resolution and high counting rate achieved by adopting semiconductor detector SDD. - Capable of non-destructive measurement of liquids, solids, sols, gels, and more. - Easy to install (only requires AC 100V-5A power supply). - The device is compact. - We are open to consultations regarding special specifications of products. - Our motto is "sincerity and integrity," so please feel free to contact us.
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