[Exhibition Participation Announcement] We exhibited at the "9th Comprehensive Non-Destructive Testing Exhibition" held in July 2019!
This time, Daiya Electronic Application exhibited at the "9th Comprehensive Exhibition on Non-Destructive Testing," where information on non-destructive evaluation, held every two years, gathered from the manufacturing industry to social infrastructure.
Approximately 40,000 visitors registered, and many products and services related to non-destructive testing for surface defect detection and internal defect detection were showcased.
Our company also exhibited non-destructive testing equipment and devices suitable for inspection targets, with the aim of "supporting quality and safety." Thank you very much for your many visits.
■ Booth Number: W2K-36

| Date and time | Wednesday, Jul 24, 2019 ~ Friday, Jul 26, 2019 10:00 AM ~ 05:00 PM |
|---|---|
| Capital | Tokyo Big Sight West Exhibition Hall, South Exhibition Hall (planned) ■ Booth Number: W2K-36 |
| Entry fee | Free Invitation ticket required (advance request *free) |
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