Distribution Measuring Instrument Product List and Ranking from 6 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Aug 27, 2025～Sep 23, 2025
This ranking is based on the number of page views on our site.

Distribution Measuring Instrument Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Aug 27, 2025～Sep 23, 2025
This ranking is based on the number of page views on our site.

  1. マイクロトラック・ベル Osaka//others
  2. シバタ ファインバブル事業部 Aichi//others
  3. ウェーブクレスト Saitama//Educational and Research Institutions
  4. 4 ナノシーズ Aichi//others
  5. 4 null/null
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Distribution Measuring Instrument Product ranking

Last Updated： Aggregation Period:Aug 27, 2025～Sep 23, 2025
This ranking is based on the number of page views on our site.

  1. [Data] Particle Size Distribution (Particle Diameter Distribution) and Particle Shape of Activated Carbon マイクロトラック・ベル
  2. Particle Size Distribution (Particle Diameter Distribution) and Particle Shape Measurement Device 'SYNC' マイクロトラック・ベル
  3. [Data] Cement and Particle Size Distribution (Grain Size Distribution) マイクロトラック・ベル
  4. Laser diffraction and scattering particle size distribution measurement device MT3000 II series マイクロトラック・ベル
  5. 5 [Data] Particle size distribution and particle shape of superabsorbent polymers マイクロトラック・ベル

Distribution Measuring Instrument Product List

31～45 item / All 109 items

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[Data] Grain size distribution (particle size distribution) and particle shape of synthetic diamonds.

[Data] Grain size distribution (particle size distribution) and particle shape of synthetic diamonds.

Particle size distribution and particle shape of diamond abrasives that determine the efficiency of grinding tools.

This document introduces the particle size distribution (particle diameter distribution) and particle shape of synthetic diamonds. Diamonds are among the hardest materials found in nature and are mined as natural ores. The particle size distribution and particle shape of diamond abrasives are crucial for determining the efficiency of grinding tools, making their characterization very important. The "CAMSIZER M1" enables high-resolution particle characterization even for very fine diamond particles. [Contents (excerpt)] - Industrial diamonds - Static image analysis using CAMSIZER M1 - Data comparison with laser diffraction and scattering devices - Features of CAMSIZER M1 *For more details, please refer to the PDF document or feel free to contact us.

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[Data] Sugar particle size distribution (particle diameter distribution) and particle shape

[Data] Sugar particle size distribution (particle diameter distribution) and particle shape

Solving the challenges of sorting. We propose a new measurement method to obtain highly reproducible and reliable results, along with examples of sugar measurement.

This document introduces the particle size distribution (particle diameter distribution) and particle shape of sugar. The standard method for measuring the particle size distribution of sugar is sieving in accordance with the ICUMSA Method GS2/9-37, and equivalent results have been obtained in round robin tests conducted across multiple laboratories. However, in practice, each laboratory follows slightly different procedures from the ICUMSA Method guidelines, resulting in significantly different particle size distributions measured by different labs, which is a concern. [Contents (excerpt)] - Sugar sieving - Systematic errors - Hardware-related issues - Human operational errors - Dynamic image analysis *For more details, please refer to the PDF document or feel free to contact us.

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Scattering of light

Scattering of light

Diffraction, refraction, reflection

The fundamental theories of light related to our particle size distribution measuring instrument can be broadly categorized into "scattering," "diffraction," "interference," "refraction and reflection," and "absorption." The particle size distribution measuring devices handled by Nikkiso apply the phenomenon of light scattering to measure the particle size distribution based on the relationship between the intensity of scattered light and the size of the particles. The characteristics of each device will be explained later in the principles section, but here we will first explain the general phenomenon of "scattering." When we talk about light scattering, it often refers to everything other than the light that travels in a straight line when light is directed at a certain substance. In other words, it is the result of a combination of the three phenomena: "diffraction," "refraction," and "reflection." *For more details, please refer to the related links or feel free to contact us.*

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Fresnel diffraction

Fresnel diffraction

Interference of secondary spherical waves

There are two teachers, Fresnel and Fraunhofer, who explained the phenomenon of diffraction. Fresnel explained this diffraction by considering the mutual interference of secondary spherical waves based on Huygens' principle, which is why it is also called the Huygens-Fresnel principle. "Each point on the wavefront at a given time acts as a source of secondary spherical waves, and the amplitude of the secondary waves decreases as the angle of inclination between the direction of the primary wave and the secondary wave increases, reaching a maximum when both waves are directed in the same direction and a minimum when they are directed in opposite directions. These phenomena arise from the mutual interference of the secondary spherical waves." *For more details, please refer to the related links or feel free to contact us.*

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The relationship between the slit width and the diffraction light intensity pattern.

The relationship between the slit width and the diffraction light intensity pattern.

Light has wave-like properties.

I believe it is unnecessary to explain again that light has wave properties and that various optical phenomena change depending on its wavelength. Now, to organize the changes in the wavelength of light and the slit diameter that will be discussed, we will introduce parameters. λ: wavelength of light, D: slit diameter, which, as can be understood from the dimensions of the numerator and denominator, becomes a dimensionless number. As α becomes smaller, the diffraction intensity pattern of Fraunhofer diffraction mentioned earlier takes the shape shown on the right side of the figure, while as α becomes larger, it takes the shape on the left side. Now, considering λ as constant, the shapes produced will change depending on whether D is large or small. Here, I will expand a little on the equations to induce the reader's drowsiness and disguise the thin content. *For more details, please refer to the related links or feel free to contact us.*

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Equation representing the intensity distribution of the diffraction pattern.

Equation representing the intensity distribution of the diffraction pattern.

Slit width of the opening = diameter of spherical particles

Until now, we have discussed diffraction in the context of illuminating an aperture, but for us, the manufacturers of laser diffraction particle size distribution measurement devices, it is fortunate that the same phenomenon can be observed when light is directed at the particles instead of the aperture hole. Furthermore, Mie theory is based on a single sphere, but it can also be applied to multiple spheres when the material and diameter are all equal, and they are distributed irregularly with a spacing that is sufficiently large compared to the wavelength. Conveniently for measurement device manufacturers, the amount of scattered light increases proportionally with the number of spheres. *For more details, please refer to the related links or feel free to contact us.*

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Refraction and reflection

Refraction and reflection

Snell's Law

Have you ever had the experience of trying to spear a fish from above the water, only to miss? This happens because the position of the fish as seen from above the water is different from its actual position. In other words, this occurs because the light coming from underwater changes direction somewhere. This is called refraction. This issue of reflection is actually an important problem for instruments that use light scattering for measurement. If the angle of the scattered light entering the surface of the cell or the lens is not carefully designed, accurate measurements cannot be made. *For more details, please refer to the related links or feel free to contact us.*

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Absorption

Absorption

Extinction and Adsorption

In this article, to distinguish between broad and narrow meanings, we will refer to the former as extinction and the latter as adsorption. For particle size analyzers, extinction is the more significant concept. First, let’s briefly explain absorption as a physical phenomenon. The presence of matter affects the propagation of light in various ways. This includes scattering, reflection, refraction, and the absorption we are discussing here. So why does this absorption occur? You know that light is a type of electromagnetic wave. This means that there is an oscillator with a certain frequency. *For more details, please refer to the related links or feel free to contact us.*

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What is the difference between number distribution and mass (volume) distribution in particle size measurement?

What is the difference between number distribution and mass (volume) distribution in particle size measurement?

Even with the same particle size distribution, the way it is represented can greatly affect the shape of the distribution, so caution is required!

The number distribution is an image when measuring the size of particles with a microscope. In other words, it is a method of representing the number and size of particles as a distribution. In contrast, the mass (volume) distribution is an image when measuring the size of particles with a sieve. This means it is a method of representing the size of particles as a distribution of mass. Additionally, when measuring the particles by size (volume) instead of mass, it is referred to as volume distribution. Even with the same particle size distribution, the representation method (number distribution and volume distribution) can lead to significantly different shapes of the distribution, so caution is required. *For more details, please refer to the related links or feel free to contact us.*

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What is the effect of refractive index in particle size measurement?

What is the effect of refractive index in particle size measurement?

Especially for particles with very small diameters, the scattering phenomenon is greatly influenced by their refractive index.

In devices that measure the light scattering of particles, such as laser diffraction and scattering particle size distribution measurement devices, the refractive index of the dispersion medium and the particles, the particle diameter, and the wavelength of the light source are important factors. As an example, the scattering light intensity due to the difference in refractive index is shown in the diagram with the particle size parameter α = πD/λ (D: particle diameter, λ: wavelength of the light source) as a variable. The scattering phenomenon changes sensitively with particle diameter and refractive index, as shown in the diagram. For large particles with low translucency, diffraction phenomena dominate the scattering phenomenon, and the influence of the refractive index is minimal. However, for small translucent particles, various phenomena that change with the refractive index, such as reflection and refraction at the particle-dispersion medium interface, light attenuation within the particle, and reflection at the inner surface of the particle, have a significant impact. *For more details, please refer to the related links or feel free to contact us.*

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Why doesn't the microtrack display accuracy?

Why doesn't the microtrack display accuracy?

There is no absolute scale for powders.

There is no absolute scale for powders, and Microtrack does not provide accuracy specifications. One reason for this is that accuracy is generally associated with measurements of length, pressure, temperature, voltage, etc., where an absolute scale exists. However, for powders, there is no absolute scale due to factors such as sample extraction, differences between production lots, sample oxidation, agglomeration, aging changes, and shape factors. For example, particularly with latex, the particle state changes due to environmental conditions, including aging. For this reason, Microtrack does not provide accuracy specifications. "NIST" also does not provide accuracy specifications. In terms of pricing related to various scales, "NIST" is recognized as an authoritative institution worldwide and serves as the basis for traceability. Here too, regarding powders, accuracy specifications are not provided, and the particle size and particle size distribution of standard samples are expressed by indicating the degree of variation in measurement results from sample extraction using methods such as microscopy and natural sedimentation. *For more details, please refer to the related links or feel free to contact us.*

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Microtrack particle size distribution measurement device, please tell me how to interpret the measurement results.

Microtrack particle size distribution measurement device, please tell me how to interpret the measurement results.

Frequently Asked Questions: Explanation of How to Interpret Measurement Results from the Microtrack Particle Size Distribution Measurement Device!

On this page, we explain how to interpret the measurement results of the "Microtrack Particle Size Distribution Measurement Device." We provide details on what is recorded where, including "Software Version," "Heading," "Particle Size Distribution Graph," and "Summary Data." For more detailed information, you can view the related links. 【Contents】 ■ Software Version ■ Heading ■ Particle Size Distribution Graph ■ Summary Data ■ Cumulative Percent Diameter or Particle Size Percent (optional setting) ■ Channel (CH) Data ■ Measurement Conditions *For more details, please refer to the related links or feel free to contact us.

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Measurement of laser particle size distribution of high concentration spray droplets (spray/mist).

Measurement of laser particle size distribution of high concentration spray droplets (spray/mist).

Demo/analysis now available. Information on the multiple scattering correction method for aerosol measurement and high-concentration spray laser particle size distribution measurement is now posted!

This page provides information on the multiple scattering correction method for measuring the particle size distribution of high-concentration sprays. It is a summary of a conference presentation given at the "11th Micronization Symposium" (December 2002). (Reference: Proceedings of the 11th Micronization Society, P174) Detailed content can be viewed through the related links. [Contents] ■ Overview ■ Measurement Data ■ Summary *For more details, please refer to the related links or feel free to contact us.

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Technical Information: Pore Size Distribution Measurement Method

Technical Information: Pore Size Distribution Measurement Method

Introduction to pore size distribution measurement methods such as "gas adsorption method" and "mercury porosimeter"!

Typical measurement methods for the pore distribution of powders and functional materials include gas adsorption methods and mercury porosimetry. The "gas adsorption method" primarily analyzes N2 or Ar gas adsorption isotherms at low temperatures (liquid nitrogen or liquid argon), allowing for the measurement of pore diameters ranging from molecular size to several hundred nanometers. The "mercury porosimeter" is a method that involves applying pressure to mercury, which is not easily wetting to the material, and determining the pore distribution from the amount forced into the sample. Additionally, in recent years, methods such as "gas permeation" and "bubble point method" have been developed to measure only the permeable pores of filters and separation membranes. For more details, please visit our website. *For more information, please refer to the related links or feel free to contact us.

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Rapid Surface Area Measurement Device (6 Samples Continuous) 'BELSORP MR6'

Rapid Surface Area Measurement Device (6 Samples Continuous) 'BELSORP MR6'

Demo/analysis now accepting. Additional sample measurements can also be conducted at the sample exchange station!

The "BELSORP MR6" is a fully automated rapid BET evaluation system that can continuously measure up to 6 samples from pretreatment to measurement and BET specific surface area calculation. By continuously performing pretreatment, cooling, and measurement of samples, it is possible to efficiently complete the entire process in about half the time compared to conventional products for 6 sample measurements. With the sample exchange station, new samples can be swapped in during measurement, allowing for additional sample measurements. 【Features】 ■ Measurement range (0.01m² and above) ■ Short measurement time (15 minutes per measurement, including calibration) ■ Excellent reproducibility achieved through automatic capture of temperature and pressure during calibration ■ Low specific surface area measurement using Kr adsorption *For more details, please refer to the PDF document or feel free to contact us.

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