Diffraction, refraction, reflection
The fundamental theories of light related to our particle size distribution measuring instrument can be broadly categorized into "scattering," "diffraction," "interference," "refraction and reflection," and "absorption." The particle size distribution measuring devices handled by Nikkiso apply the phenomenon of light scattering to measure the particle size distribution based on the relationship between the intensity of scattered light and the size of the particles. The characteristics of each device will be explained later in the principles section, but here we will first explain the general phenomenon of "scattering." When we talk about light scattering, it often refers to everything other than the light that travels in a straight line when light is directed at a certain substance. In other words, it is the result of a combination of the three phenomena: "diffraction," "refraction," and "reflection." *For more details, please refer to the related links or feel free to contact us.*
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【Theory Explaining Scattering】 ■ Particle size D >> wavelength λ: Geometric scattering ■ Particle size D ≈ wavelength λ: Mie scattering ■ Particle size D < wavelength λ: Rayleigh scattering *For more details, please refer to the related links or feel free to contact us.
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We are a comprehensive manufacturer of powder and particle property measurement equipment. As professionals in "powder and particles," we consistently provide leading technology and services in the industry.