The probe heads are arranged above and below, allowing for simultaneous in-circuit testing of both sides of the substrate. (Supported substrate size for inspection: up to 985×610)
The simultaneous use of upper and lower flying probes allows for a combination inspection of up to 6 probes, enabling the inspection of components that can make contact at both points on the top and bottom of the substrate.
This model boasts world-class standards in speed and positioning accuracy while expanding the compatible substrate size to W635×D610mm.
Additionally, by adding an optional split inspection function, it can also inspect long substrates up to W985×D610mm.
It can accommodate component heights of up to 60mm and substrate weights of up to 10kg, making it suitable for inspecting substrates used in automotive, aerospace, and medical devices, as well as power boards and probe cards, which are larger and heavier.
★Evaluation tests can be conducted by bringing in substrates to the demo room at our Okayama headquarters★
A complete testing process is possible, including the creation of inspection programs, testing using actual substrates, and summarizing evaluation results. If you are interested, please apply through the 'Contact Us' section below.