Ultra-compact spectral phase and intensity measurement analysis device (LX-SPIDER)
APE Corporation LX-SPIDER
Smaller than a laptop and portable anywhere, easy alignment with automatic calibration feature.
The LX-SPIDER is a device that uses the SPIDER method for phase and intensity measurement of ultra-fast lasers, enabling single-shot measurements and real-time phase measurement and analysis. It is ultra-compact, easy to align, and equipped with an automatic calibration function. Features: ● Wavelength range: 750~900nm ● Pulse width: Optical set 1... 16~150fs Optical set 2... 70~300fs ● Measures spectral phase, intensity, and temporal intensity of Ti:Sa lasers to check performance ● Single-shot measurement ● Real-time analysis ● Equipped with automatic calibration function, no adjustment required upon delivery
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basic information
SPIDER is a device that uses the SPIDER method for phase and intensity measurement of ultra-fast lasers, enabling single-shot measurements and making accurate measurements possible, which were previously difficult. Moreover, thanks to a very fast analysis algorithm, phase measurement and analysis can be performed in almost real-time.
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Applications/Examples of results
The ultra-compact (180 x 210 x 100mm) LX-SPIDER is smaller than a laptop and can be carried anywhere. It measures femtosecond spectral phase in real-time and supports single-shot measurements. Unlike traditional SPIDERs that require cumbersome spatial/temporal alignment, it features an automatic calibration function, making alignment easy and eliminating the need for adjustment upon delivery. It is also ideal as a complex laser adjustment tool, such as for regenerative amplifiers. Wavelength range: 750-900nm
Company information
Our company started with the import and sales of laser oscillators and optical devices and components, and has developed through the import and sales of innovative and original electronic optical devices from around the world, as well as the provision of advanced technical services. Our main products include a variety of laser light sources ranging from semiconductor lasers to nano, pico, and femtosecond lasers, along with various devices and measurement instruments for their adjustment and control. In the field of optical spectroscopy and analysis, we offer high-performance multi-spectral fiber-coupled spectrometers and their application measurement systems (color, luminescence, absorption, Raman spectroscopy, fluorescence, plasma, LIBS, etc.), as well as thermal imaging IR cameras. Furthermore, in response to the development of thin film technology, we handle thin film measurement instruments such as thin film adhesion strength testers and optical interference film thickness monitors. Moving forward, we will enhance various applications and after-sales services to respond quickly to user demands. We will continue to firmly establish ourselves in the fields of light and nanotechnology, adapting to market trends and aiming for further development as a frontier trading company that serves everyone.
