Designed to inject electromagnetic pulses into safety-critical circuits with high temporal and spatial resolution.
Product Highlights - Maximum voltage for interference pulse generation is up to 1000 V - Two interference pulses can be generated continuously within 25 ns - Probe tip with a coil diameter of 250 µm (depending on the model)
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basic information
Hardware fault injection is known as an established potentially dangerous method for cracking security-protected systems. Electromagnetic fault injection (EMFI) exposes the targeted system to localized magnetic field pulses, which can lead to physical disruptions of the device or logical errors. Unlike software attacks that exploit vulnerabilities that rarely occur, hardware attacks can occur independently of these vulnerabilities, making them more likely to succeed against a larger number of targets. One of the key features of the new pulse probe is the extended voltage range used to generate disruption pulses, which can reach up to 1000 V (significantly increasing disruption power), allowing for the discovery of new vulnerabilities. The second important feature is the ability to release two disruption pulses within a minimum of 25 ns. This enables successful attacks on enhanced systems against a single disruption event. The ICI-DP probe from Langer EMV-Technik provides the highest pulse power, allowing for detailed analysis and robust protection of devices.
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Applications/Examples of results
- Electromagnetic Fault Injection (EMFI) - EM Pulse Coupling - IC Security / Embedded Security - Advanced attacks possible using double pulse sequence
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| Model number | overview |
|---|---|
| ICI-DP HH1000-15 | Probe head dimensions: Diameter 1000µm Rise time: 2 nanoseconds Minimum double pulse sequence time: 25 nanoseconds (200V) Polarity (set by software): +/- Voltage: 50-1000V Maximum jitter (standard): ±1 nanosecond Minimum trigger pulse delay: 35 nanoseconds |
| ICI-DP HH500-15 | Probe head dimensions: Diameter 500µm Rise time: 2 nanoseconds Minimum double pulse sequence time: 25 nanoseconds (200V) Polarity (set by software): +/- Voltage: 50-1000V Maximum jitter (standard): ±1 nanosecond Minimum trigger pulse delay: 35 nanoseconds |
| ICI-DP HH250-15 | Probe head dimensions: Diameter 250µm Rise time: 2 nanoseconds Minimum double pulse sequence time: 25 nanoseconds (200V) Polarity (set by software): +/- Voltage: 50-1000V Maximum jitter (standard): ±1 nanosecond Minimum trigger pulse delay: 35 nanoseconds |
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Company information
As a company that provides unique and innovative solutions in EMC testing and general measurement, Wavecrest Corporation is active in this field. The increasingly advanced electronic and communication environment not only affects the performance of its products but also serves as a social infrastructure that impacts the overall safety of society, requiring high safety and reliability. We aim to offer new products and solutions that the market needs, without being constrained by traditional testing methods and equipment.
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