Acquisition of ISO/IEC 17025 laboratory accreditation! Reliable testing services through a controlled environment and established procedures.
This document provides a detailed explanation of the "Contract Analysis Service Reliability Evaluation" conducted by Toshiba Nanoanalysis Corporation. It richly introduces various tests, such as temperature cycle tests for electronic components to confirm resistance against thermal stress caused by temperature changes, and X-ray irradiation tests to evaluate the effects and resistance of materials. Please feel free to consult us when you need our services. 【Contents】 ■ Reliability Testing ■ Temperature Cycle Testing for Electronic Components ■ Observation of Aging Degradation through Temperature Cycle Testing ■ Observation of Aging Degradation through Thermal Shock Testing ■ X-ray Irradiation Testing ■ Solder Heat Resistance Testing for Surface Mount Components ■ Bond Strength Testing for Semiconductor Packages *For more details, please refer to the PDF document or feel free to contact us.
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Our company offers contract analysis services. Since our establishment in August 2002, we have utilized reliable analysis and analytical techniques along with state-of-the-art equipment to provide optimal nano-level microfabrication, analysis, evaluation of reliability, environmental safety chemical analysis, and service solutions for a wide range of markets centered around semiconductors, LCDs, metals, and new materials. Please feel free to contact us if you have any requests.