The design frequency ranges from 1 kHz to 2 MHz, with a VGS voltage reaching ±40V and a VDS voltage reaching 200V/1500V/3000V.
【Product Overview】 The Semiconductor Device C-V Characteristic Analyzer TH510 Series is an analytical device designed for the design and research of semiconductor materials and components. It innovatively adopts next-generation technologies such as dual CPU architecture, a Linux-based system, a 10.1-inch capacitive touchscreen, an English operating interface, and built-in instructions and help. It can accommodate automatic integration and classification on production lines, as well as research and development and analysis in laboratories. The design frequency of the Semiconductor Device C-V Characteristic Analyzer TH510 Series ranges from 1kHz to 2MHz, with a VGS voltage reaching ±40V and a VDS voltage reaching 200V/1500V/3000V. It supports CV characteristic testing and analysis of conventional semiconductor components such as diodes, triodes, MOS tubes, and IGBTs. Thanks to the 10.1-inch capacitive touchscreen with a resolution of 1280*800, the TH510 Series can display four parameters simultaneously. All settings, monitoring, sorting parameters, statuses, and more can be displayed on the same screen, avoiding the hassle of frequent switching between screens.
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basic information
**Main Features** • 10.1-inch capacitive touchscreen with a resolution of 1280*800, Linux system • Dual CPU architecture with a maximum test speed of 0.56ms (1800 times/second) • Three testing methods: spot test, list scan, and graphic scan (optional) • Four parasitic parameters (Ciss, Coss, Crss, Rg) are measured and displayed on the same screen • Integrated design: LCR + high voltage source + channel switching • Standard 2-channel testing capable of testing two devices or dual chip devices simultaneously; channels can be expanded up to 6 channels, and channel parameters are saved individually • Fast charging reduces capacitor charging time, enabling quick testing • High-speed turn-on test for conduction • Automatic delay setting • High bias: VGS: 0 - ±40V, VDS: 0 - 200V/1500V/3000V • Sorting of 10 bins
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Applications/Examples of results
• Semiconductor components and power components Parasitic capacitance testing and C-V characteristic analysis of diodes, transistors, MOSFETs, IGBTs, thyristors, integrated circuits, optoelectronic chips, etc. • Semiconductor materials Wafer dicing, C-V characteristic analysis • Liquid crystal materials Dielectric constant analysis
Detailed information
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Semiconductor Device Analyzer TH511/TH512/TH513
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Semiconductor Device Analyzer TH511/TH512/TH513 Specifications
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Semiconductor Device Analyzer TH511/TH512/TH513 Specifications
Line up（3）
| Model number | overview |
|---|---|
| TH512 | 2CH, Vds range: 0 - ±1500V |
| TH511 | 2CH, Vds range: 0 - ±200V |
| TH513 | 1CH, Vds range: 0 - ±3000V |
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Company information
As a company that provides unique and innovative solutions in EMC testing and general measurement, Wavecrest Corporation is active in this field. The increasingly advanced electronic and communication environment not only affects the performance of its products but also serves as a social infrastructure that impacts the overall safety of society, requiring high safety and reliability. We aim to offer new products and solutions that the market needs, without being constrained by traditional testing methods and equipment.
![[Data] Example of EPMA Analysis 2](https://image.www.ipros.com/public/product/image/e69/2000641214/IPROS91990322899660008319.png?w=280&h=280)
