Characteristic frequency range: RF pulse current monitoring probe from 1Hz to 200MHz.
The probe shows a very flat response from 30Hz to 70MHz and is characterized by a frequency range from 1Hz to 200MHz. In contrast to the RF current monitoring probes designed for EMC applications typically used for measurements in the frequency domain, the TBPCP2-3070 is used for surge or RF pulse current monitoring applications in the time domain. The aperture of the RF current monitoring probe is 25 mm. The transfer impedance measured with a 50Ω + 50Ω loop test fixture is -26 dB Ohms with a 3dB bandwidth from 30Hz to 70MHz.
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basic information
【Specifications】 ● Characteristic frequency range: 1Hz to 200MHz ● 3 dB bandwidth: 30 Hz to 70 MHz (measured with 50 + 50 Ω loop) ● Transmission impedance to 50 ohm load: -26 dB ohms. 0.05V/A ● Transmission impedance to high Z: 0.1 V/A ● Probe port impedance: 50 ohms ● Drop rate: < 20%/ms ● Rise time: < 5 ns ● Maximum primary RMS AC current rating for internal resistance: 40A ● Maximum primary single pulse current rating for internal resistance: 200A @ 100ms pulse width. 400A @ 1ms pulse width ● Maximum current time product: 0.01 ampere-seconds ● Maximum RMS AC current, linear: 4 A ● Maximum core temperature: 80 °C ● Aperture diameter: 5.5mm ● Outer diameter: 27mm ● Length including SMA connector: 40mm Height: 19mm ● Weight: 60g ● Connector type: SMA female
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Detailed information
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RF Pulse Current Monitoring Probe TBPCP2-3070
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RF pulse current monitoring probe TBPCP2-3070
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RF pulse current monitoring probe TBPCP2-3070
Company information
As a company that provides unique and innovative solutions in EMC testing and general measurement, Wavecrest Corporation is active in this field. The increasingly advanced electronic and communication environment not only affects the performance of its products but also serves as a social infrastructure that impacts the overall safety of society, requiring high safety and reliability. We aim to offer new products and solutions that the market needs, without being constrained by traditional testing methods and equipment.
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