Source Major Unit (SMU) High-Precision Source/Measurement Unit
TH1991/TH1991A/TH1991B/TH1991C/TH1992/TH1992A
Ideal for testing semiconductors, active/passive devices, and various other devices and materials.
The TH1991/TH1992 series high-precision source/measurement units can output DC voltages up to ±210V, DC currents of ±3A, and pulse currents of ±10.5A, with a minimum power and measurement resolution of 10fA/100nV. They support high-speed sampling and can generate arbitrary waveforms. Additionally, they feature a Linux operating system as the base layer, a 7-inch capacitive touchscreen with an interactive graphical user interface, and various display modes. They are equipped with diodes, triodes, MOS tubes, IGBTs, and other devices. The I/V curve scanning function allows for IV function tests to be completed without connecting to a host computer, significantly improving testing efficiency. The TH1991/TH1992 series high-precision source/measurement units offer comprehensive and integrated power and measurement capabilities, making them ideal for testing semiconductors, active/passive devices, and a variety of other devices and materials. They are widely used in R&D and educational applications, industrial development, testing, and manufacturing.
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basic information
• 10fA current output and measurement resolution. 100nV voltage output and component resolution. • Maximum voltage output of ±210V. Maximum current output of ±3.03A (DC)/±10.5A (pulse). • Supports DC, pulse, sweep, and list output. • Minimum sampling interval of 1μs. • Built-in I/V curve sweep function and time-domain waveform scrolling display function. • Pulse width of pulse output can be reduced to as small as 50μs. • Both 2-wire and 4-wire measurement. • Output filter time constant (or cutoff frequency) can be freely set to achieve any frequency response output. • 14-level sorting function including grading and sorting mode. • Arithmetic functions, moving average filter function, deviation subtraction function. • Semiconductor parameter analysis function for quickly generating characteristic curves of commonly used devices. • Four basic modes: voltage source, current source, voltmeter, ammeter, and ohmmeter. • Delta low-resistance testing method that can effectively correct measurement errors due to thermoelectricity.
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Applications/Examples of results
■ Testing of semiconductors, discrete components, and passive components - Diodes, laser diodes, LEDs - Optical detectors, sensors - Field effect tubes, triodes - ICs (IC, RFIC, MMIC) - Resistors, variable resistors, thermal electronics, switches ■ Testing of precision electronic devices and green energy devices - PV - Power semiconductors - Batteries - Vehicles - Medical devices - Power supplies and DC bias sources for board-level testing ■ Research and education - New material research - Nano device characteristics - Giant magnetoresistance - Organic devices - Any high-precision I/V source or measurement
Detailed information
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Model lineup
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Source Major Unit (SMU) TH1991 Series
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Source Major Unit (SMU) TH1991 Series
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Source Major Unit (SMU) TH1991 Series
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Source Major Unit (SMU) TH1991 Series
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Source Major Unit (SMU) TH1991 Series
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Company information
As a company that provides unique and innovative solutions in EMC testing and general measurement, Wavecrest Corporation is active in this field. The increasingly advanced electronic and communication environment not only affects the performance of its products but also serves as a social infrastructure that impacts the overall safety of society, requiring high safety and reliability. We aim to offer new products and solutions that the market needs, without being constrained by traditional testing methods and equipment.
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