X-ray single crystal orientation measurement device s-Laue

basic information

Features of this product 1. Compact and lightweight Utilizing the technology of the μ-X360s, which achieves the world's smallest and lightest class, we have created a compact and lightweight device. 2. Easy operation The X-ray is emitted in a vertical downward direction, making it easy to attach samples, and precise alignment can be performed accurately using a microscope. It is also easy to handle, allowing anyone to operate it effortlessly. 3. Fast and high-precision measurement With a standard collimator (X-ray irradiation diameter: approximately Φ1mm), measurements can be completed in about 60 seconds. Additionally, our unique image processing technology allows for the output of clear and high-precision Laue spot images. 4. Ensured safety By adopting low-output X-rays, safety is guaranteed. Furthermore, the interlocked shielding cover completely prevents exposure, allowing anyone to use it safely. There is no need for certification as an X-ray work supervisor. Applications - Orientation confirmation and adjustment for cutting single crystal materials (ingots, wafers, etc.) - Evaluation of crystallinity (single crystal/twinned/multicrystalline, changes in crystallinity, symmetry)

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Applications/Examples of results

【Uses】 - Measurement of main surface orientation - Confirmation and adjustment of cutting orientation - Crystallinity evaluation - Crystal growth and processing related - Semiconductor device manufacturing and development