Up to 21 million pixels SWIR camera

A new pixel-shifting SWIR camera capable of high-resolution (5M, 12M, 21M) imaging and various inspection applications has arrived!

By conducting inspections at a maximum resolution of 21M and SWIR wavelengths, we capture defects that are typically undetectable, contributing to the efficiency of production. 【Examples of SWIR Camera Utilization】 - In wafer inspections, scratches that are invisible under visible light are detected. - Through-holes in substrates can be highlighted, simplifying the inspection of hole positions and sizes. - Objects that appear the same color under visible light are reflected in different colors under SWIR wavelengths due to differences in moisture permeability, allowing for differentiation of materials and contents. - Depending on the type of liquid, light is absorbed or transmitted, enabling the determination of the presence and quantity of contents, as well as the mixing of foreign substances. - Contents can be confirmed by penetrating bottle labels and plastic candy bags. - Leaf veins and bruises on fruits become more pronounced, making them effective for freshness checks and quality inspections. Previously, we offered the SXGA resolution "VCC-SXCXP1SW," but we are now introducing the new high-resolution pixel-shift SWIR camera "VCC-SXCXP1SWPS" with a maximum resolution of 21M. The camera is equipped with an actuator incorporating our proprietary piezoelectric elements, enabling even higher precision imaging.

Security cameras and surveillance systemsAnalysis and prediction systemOther analytical equipment