Probe-type OCT system using high-speed swept source
We provide the best system tailored to your needs through in-house design and manufacturing, along with customized device configurations and software development. 【Features】 ■ Utilizes near-infrared light, allowing for non-contact high-speed measurements without the worry of X-ray exposure. ■ Eliminates the complexity of exposure countermeasures, source management, and the use of ultrasound gel. ■ Measurement depth: 5–10nm, resolution: 4–13μm (in the depth direction). ■ Positioning through real-time 2D image observation, seamlessly transitioning to 3D image measurement. Capable of capturing one volume in just a few seconds. ■ Center wavelengths can be selected from 1060nm, 1310nm, or 1550nm. Options available for MEMS type or VCSEL type.
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Applications/Examples of results
【Applications】 - Resin products: Fusion state, welding process analysis - Industrial products (plastic, ceramic, pearl): Inspection of shape, thickness, foreign substances, and cracks. Analysis of deterioration. - Laser welding, metal surfaces: Shape observation (defect analysis), scratch inspection - Skin measurement: Observation of sweat glands, skin texture, analysis of moisture penetration history, etc. 【Custom Specifications Support】 - Production of probes tailored to sample shapes - Creation of measurement jigs, fiber lengths, and auxiliary units suited to the site - Development of individual software tailored to the analysis We propose system configurations that align with your operations and conduct consultations. *For more details, please feel free to contact us.
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Cross-sectional image of a tablet case
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Tape fault image 1060nm: High-resolution model
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Tape fault image 1310nm: High depth reach model
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