Standard equipped with Mecha I/F! Enables device operation over USB and allows control of the main unit with a panel-like interface.
The "FX-210/210L" is a short-open test unit that tests all pins using a unique algorithm, automatically collects data between all pins, and enables stable judgment through a comparison method. It has an ultra-compact size that fits in a 5-inch bay. Utilizing expertise in circuit board technology for measuring instruments, it has made it possible to standardly equip 128 pins in this size. In the future, Kyouritsu Test System plans to continuously introduce new lineups based on customer requests. It can connect with the Focus Series Function Tester, which supports a variety of tests. 【Features】 ■ Comprehensive pin testing ■ Ultra-fast testing ■ Uses semiconductor switches ■ Ultra-compact size ■ Windows PC control software ■ Connection with external devices ■ Programmable judgment values ■ Expandable in 128-pin units ■ High potential for future expansion *For more details, please refer to the PDF materials or feel free to contact us.
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【Other Features】 - Standard software for PC control - Device operation via USB, allowing control of the main unit with a panel-like interface - Easy input and output of start/results from other devices connected to the sequencer - External printer available - Utilizing technology gained from ICT, a newly developed hardware short/open test system achieves even faster testing - By using semiconductor switches in the MPX section that do not have a lifespan, maintenance costs are minimized - Prevents stress on the measured substrate by avoiding the accumulation of static electricity - Stable measurements are possible by having three threshold values based on the track record of short/open tests on mounted substrates (these settings can be configured within 1Ω to 1KΩ) - Standard size supports 128 pins by default - Using an M-size case allows expansion up to 512 pins (further pin counts can be accommodated upon consultation) *For more details, please refer to the PDF document or feel free to contact us.
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【Purpose】 ■ Semiconductor substrate inspection *For more details, please refer to the PDF document or feel free to contact us.
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