For continuous monitoring of thin films! Inline non-destructive analysis fluorescent X-ray analysis device.

A customizable, inline fluorescent X-ray analysis device! It allows for continuous and high-precision monitoring of film coating thickness and liquid component analysis.

We would like to introduce our line-integrated energy-dispersive fluorescent X-ray analysis device, "OURSTEX100TA-F," which utilizes our non-destructive analysis technology. When integrated into a film deposition device, it enables continuous measurement of film thickness and continuous composition analysis of substances deposited on the film. It also allows for continuous analysis and measurement of components contained in the film body and resin. Additionally, it can be applied for continuous monitoring of fluid composition. Through customization, we can offer proposals tailored to your needs, such as monitoring target elements and external interfaces. 【Features】 ■ Continuous measurement of film thickness and continuous analysis of composition in-line ■ Analysis and measurement of components contained in films and resins are also possible ■ Applicable for continuous monitoring of fluids ■ Power supply is only AC100V, energy-saving device ■ Equipped with SDD detector, no need for liquid nitrogen or cooling water ■ Customizable according to customer requirements 【Examples of Applications】 ◎ In-line analysis of high-performance films ◎ In-line analysis of metal foils ◎ In-line analysis of solutions and liquids *For more details, please refer to the PDF document or feel free to contact us.

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