Non-destructive X-ray observation is effective for initial inspections! We will introduce examples of defect analysis.
We would like to introduce a case study of defect analysis using X-ray observation of an AC adapter. Upon observing an AC adapter with unstable output using an X-ray observation device (YXLON Cheetah EVO), a disconnection point was discovered. During fluoroscopic observation, no abnormalities were found in the internal components or solder joints, but a location suspected of disconnection was identified at the base of the wiring. Non-destructive X-ray observation is effective for initial inspections. [Defect Analysis Case Study] ■ Subject: AC Adapter ■ Equipment Used: X-ray Observation Device (YXLON Cheetah EVO) ■ Disconnection Point: Wire Base *For more details, please refer to the PDF document or feel free to contact us.
Inquire About This Product
basic information
For more details, please refer to the PDF document or feel free to contact us.
Price range
Delivery Time
Applications/Examples of results
For more details, please refer to the PDF document or feel free to contact us.
catalog（15）
Download All Catalogs
![[Cheetah EVO Case Study] Observation of Inductor Coils (Orthogonal CT Observation)](https://image.www.ipros.com/public/catalog/image/01/d94/478426/IPROS11705774122712488334.jpeg?w=120&h=170)
![[Cheetah EVO Case Study] Observation of IC Type Coils](https://image.www.ipros.com/public/catalog/image/01/40e/478427/IPROS43080621970966399269.jpeg?w=120&h=170)
![[Case Study] X-ray Fluoroscopy and CT Examination Equipment](https://image.www.ipros.com/public/catalog/image/01/779/511806/IPROS69821420652988785136.jpeg?w=120&h=170)
![[Defective Analysis Case] X-ray Observation of AC Adapter](https://image.www.ipros.com/public/catalog/image/01/409/549849/IPROS70295238176529335250.jpeg?w=120&h=170)
![[Observation Case] X-ray Observation of a Toggle Switch](https://image.www.ipros.com/public/catalog/image/01/9cc/549975/IPROS28998578668948308132.jpeg?w=120&h=170)
Company information
Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.