Introducing a micro imaging system using a micro-focus X-ray source and a high-resolution detector!
The "TXR-H1R50PS-01" is a micro imaging system that uses a micro-focus X-ray source and a high-resolution detector. It is suitable for detecting minute defects in electronic components using pulsed X-rays. Compact, lightweight, and ultra-high precision, it can be used safely and securely with easy operation. 【Features】 ■ Compact and lightweight ■ Ultra-high precision ■ Easy operation ■ Safe and secure *For more details, please refer to the PDF document or feel free to contact us.
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【Specifications】 ■X-ray source focal size: 10μm; Power: 3–12W ■Voltage: 12–50kV; Maximum current: 1mA; Exposure time: 100–4500ms ■Power supply unit size: W210×H180×D256mm; Weight: 4.2kg (X-ray source and power supply) ■Detector light receiving surface size: 26mm (height) × 34mm (width) Number of pixels: 1300 (height) × 1706 (width); Pixel size: 20×20μm *For more details, please refer to the PDF document or feel free to contact us.
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【Purpose】 ■Detection of minute defects in electronic components, etc. *For more details, please refer to the PDF document or feel free to contact us.*
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Tsukuba Technology Co., Ltd. is engaged in the development, manufacturing, and sales of non-destructive testing equipment. - Laser ultrasonic visualization inspection equipment - Compact X-ray inspection equipment - Compact ultrasonic C-Scan inspection equipment - Radiation measurement related devices