Non-contact XY mapping measurement infrared thickness gauge film thickness measurement device

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last updated：Jun 05, 2020

アイオプチカ

Official site

Infrared Non-Contact Thickness Gauge "Easy Operation and Maintenance-Free!"

<X-Y Mapping Measurement Possible> Mapping measurements can be performed while moving the work in the XY direction. <Ready-to-Use Operability> Automatically creates a calibration curve from the reference piece. Measurement can be started immediately. <Maintenance-Free> There are no short-term replacement parts such as light sources or line sources.

Related Link - https://www.aioptica.com/

Inquire About This Product

basic information

Worksheet mapping measurement Total thickness of various coating films Barrier film thickness Metal thin film thickness measurement Carbon film thickness measurement

Price information

It will be a quotation based on specifications.

Price range

Delivery Time

Please contact us for details

※For 3 months～

Applications/Examples of results

Ceramic thickness measurement Green sheet thickness measurement Specific layer limited thickness measurement within multilayer films

Detailed information

●Compact and lightweight design The system consists only of a PC for configuration and display (Operations can also be performed on the measurement device) Data output available
● Automatically creates a calibration curve from the standard sample. Measurement can start immediately.
● We will carry out structural design that responds to the site and accommodates existing facilities. ● Installation is possible in both horizontal and vertical directions. ● Strict installation accuracy (such as angles and distances) is not required.
●This is a measurement type for the edge part of the work, suitable for inflation films and similar materials.
● XY Mapping Film Thickness Measurement Type Automatically feeds the workpiece in the XY direction and measures the thickness distribution. The measurement results are displayed on the PC screen. *The photo shows a fixed-type demo machine.