Significantly reduce the time required for analyzing signal integrity conditions!
Compliance testing is essential to ensure that the timing, slew rate, and voltage levels of Dynamic Random Access Memory (DRAM) signals conform to specifications. By utilizing eye diagram testing, the time required for analyzing signal integrity conditions can be significantly reduced, allowing for quick inspection of signal quality. The following challenges are addressed by the "DDR3 Data Eye Diagram Test": [Challenges] ■ Lack of flexibility to quickly debug signal integrity issues ■ Need for separation of read/write operations ■ Overlapping of consecutive bits within a data burst for testing based on a simple mask *For more details, please refer to the PDF document or feel free to contact us.
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**Overview** In the DDR3 interface test for DRAM, compliance testing can evaluate interoperability with JEDEC standards. When debugging signal integrity issues, features and tools such as mask tests, eye diagram tools, and read/write separation are necessary to facilitate the analysis process. Therefore, the "R&S RTx-K91" option includes all the compliance and debugging features required for DDR3 testing. *For more details, please refer to the PDF document or feel free to contact us.*
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For more details, please refer to the PDF document or feel free to contact us.
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Rohde & Schwarz was founded in 1933 by Dr. Rohde and Dr. Schwarz. The company has maintained its purpose since its inception: "to remain a technology company that creates innovative solutions in the fields of electronics and wireless communication, contributing to society." The Rohde & Schwarz Group (headquartered in Munich, Germany) specializes in wireless communication and leads the world in electronic measurement, broadcasting, secure communications, wireless monitoring, and radio detection. Rohde & Schwarz Japan celebrated its 20th anniversary on April 1, 2023.