The only device capable of measuring the thermal properties of thin films on the nanometer order.
The NanoTR and PicoTR thin film thermal property measurement devices are the world's first instruments capable of accurately measuring the thermal properties of metal films, oxide films, and organic films. 【Features】 ■ Capable of measuring thermal diffusivity, thermal conductivity, and interfacial thermal resistance of thin films with thicknesses ranging from several tens of nanometers to several micrometers. ■ Equipped with both RF and FF measurement methods, allowing measurements regardless of the type of substrate. ■ SI traceable device, compliant with JIS R 1689 and JIS R 1690. *For more details, please refer to the catalog or feel free to contact us.
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basic information
【Technical Specifications】 ■Pump Laser ・Pulse Width: 1 ns ・Wavelength: 1550 nm ・Beam Diameter: 100 μm ■Probe Laser ・Pulse Width: Continuous ・Wavelength: 785 nm ・Beam Diameter: 50 μm ■Measurement Items: Thermal Diffusivity, Thermal Penetration, Thermal Conductivity, Interface Thermal Resistance ■Measurement Time: Approximately 60 seconds ■Sample (RF Method) ・Resin: 30 nm to 2 μm ・Ceramics: 300 nm to 5 μm ・Metal: 1 μm to 20 μm ■Weight: Approximately 40 kg *For more details, please refer to the catalog or feel free to contact us.
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【Applications】 ■ Semiconductor and Memory Storage ■ Metal and Ceramic Composites ■ LED Electronics ■ Thermoelectric Materials, Solar and Fuel Cells *For more details, please refer to the catalog or feel free to contact us.
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Company information
Netch Japan Co., Ltd. was established in September 2012 as the Japanese subsidiary of Netch, which boasts the world's top market share in thermal analysis and thermal property measurement equipment, by acquiring the business of the Burker brand thermal analysis equipment. With a wide range of products from high-end items to high-performance, low-cost options, we meet the diverse needs of our customers from research and development to quality control.
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