A simulator equipped with various functions for optical analysis.
■High-precision analysis of nanoscale phenomena is possible through wave optics simulations. ■A solver using the FDTD method (Finite-Difference Time-Domain method) and a user-friendly graphical user interface strongly support research and development tasks.
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basic information
- A simulator that adopts the FDTD method, providing high computational accuracy and a wide range of applications. - It can use subgrids in addition to non-uniform grids, allowing for the flexible setting of fine grids in specific areas as needed, enabling efficient simulations while maintaining high computational accuracy. - It supports metal medium models in the optical wavelength range and can calculate phenomena such as surface plasmon enhancement, which is important in near-field optical applications. - Equipped with various wave source models, it allows for the setting of parameters specific to the optical field, such as polarization, angle of incidence, aperture shape, incident intensity distribution, and lens usage, enabling practical analysis. - Capable of importing various 3D CAD data. - A cluster version is also available.
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Detailed information
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[Analysis Case: 1] ■Analysis of Silicon Solar Cells Using Moth-Eye Type Anti-Reflection Coating The reflection characteristics of solar cells with a moth-eye structure added to the surface of a silicon substrate are being analyzed.
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[Analysis Case: 2] ■Analysis of Silicon Solar Cells Using Localized Surface Plasmons of Gold Nanoparticles The behavior of the electromagnetic field scattered within the silicon substrate is analyzed using the localized surface plasmons of gold nanoparticles. The dispersion characteristics of gold and silicon are also taken into account.
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[Analysis Case: 3] ■ Analysis of the Absorption Characteristics of Solar Cells Using Silicon Nanowire Arrays The absorption characteristics of silicon nanowires in response to planar electromagnetic waves are being analyzed.
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[Analysis Case: 4] ■Crosstalk Analysis of CMOS Image Sensors Taking into account the medium characteristics such as color filters and silicon, we model the CMOS image sensor and analyze the crosstalk of light within the device.
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[Analysis Case: 5] ■Analysis of Surface Plasmon We are analyzing the phenomenon where surface plasmons are confined and propagate at the interface between a metal and a dielectric.
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[Analysis Case: 6] ■Superlens Effect Using Left-Handed Materials This is an analysis case of the superlens effect using left-handed materials that exhibit a negative refractive index.
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[Analysis Case: 7] ■Analysis using oblique incidence function under periodic boundary conditions This analyzes the condition where a uniform plane wave is incident obliquely at an arbitrary angle within the analysis area with periodic boundary conditions.
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[Analysis Case: 8] ■Analysis of the transmission characteristics of photonic crystals
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[Analysis Case: 9] ■Thermal Analysis of Optical Fiber Probe Model
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■New products related to barcodes ■Laser diode related ■We accept orders for optical fiber connector processing. *We are currently accepting orders for communication and large diameter connectors with short delivery times! ■Manufacturing of ultra-stabilized LD modules and light source devices ■Import and sales of various semiconductor lasers ■Import and sales of optical modulators and optical peripheral components ■Other import and sales of scientific and analytical instruments and parts