No. 711 Nanometer Micro Displacement Measurement System
Catalog No. 711
It is a light interference measurement system capable of measuring minute changes on the order of nanometers in real time.
This is a new optical interference measurement system that uses the statistical characteristics of the scattering field (laser speckle) generated when a rough surface is illuminated with a laser, which serves as a standard that is completely random and is not subject to limitations imposed by the precision of optical elements or the measurement target. 【Product Features】 〇 Capable of sub-nanometer measurements 〇 Non-contact and non-invasive measurement 〇 Applicable to biological systems such as plant growth and changes in trees *For more details, please download the PDF or contact us.
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Toyo Seiki Seisakusho Co., Ltd. is a comprehensive manufacturer of various material testing machines and environmental testing equipment targeting fields such as plastics, rubber, paints, paper, and textiles. Since its establishment in 1934, we have been dedicated to "testing machines" and have supported our customers' research and development and quality control in various fields. We will continue to refine our technological capabilities and respond to our customers' needs. [Product Development Timeline] 1955: Thermoplastic Resin Fluidity Testing Machine 'Melt Indexer' 1960: Universal Material Testing Machine 'Strograph' 1963: Curing Testing Machine 'Oscillating Disk Rheometer (ODR)' 1970: Mixing and Extrusion Testing Equipment 'Laboplast Mill' 1982: Capillary Rheometer 'Capillograph'