Detecting a moving point of 0.05mm at a distance of 2m from a width of 1.4m.
The Super 5000K 7K model converts human visual functions into electronic circuits, allowing it to instantly detect a point with an angle of 50 micrometers (0.05mm), which can only be seen by a human from a distance of 24cm, within a field of view of 1.4m from 2m away. The ultra-high-precision camera "7K model = photo," which increases the number of pixels in the line sensor from the conventional "5K model" of 5120 pixels to 7450 pixels, updates the world's best record for the first time in 18 years since 1994, detecting minute defects with 144 times the accuracy of the human eye and color variations with more than 100 times the accuracy of human vision. ● For more details, please download the catalog or contact us.
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**Features** ■Detection of 0.05mm points corresponds to a line speed of 30m per minute. →For 0.5mm points, the field of view expands to 14m, allowing for a high-speed line of 300m per minute. ■Automatic inspection beyond visual capability is possible even for three-dimensional shapes or objects in a bent state. →The depth of field (focus depth) when detecting 0.05mm points is plus or minus 20cm, which is 6600 times greater than that of a CCD camera. ●For more details, please download the catalog or contact us.
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We specialize in systems for visual inspection areas and pattern inspections where the target patterns share the same trend. We can conduct inspections of the exterior of automobile bodies and materials such as stainless steel, copper, and titanium, as well as inspections of glass, tiles, and materials like paper and film. Our systems can be installed on any line from materials to processes to products, allowing for exterior inspections. Tekunos has achieved performance that far exceeds visual inspection through our uniquely developed high-sensitivity electronic cameras for inline use and our proprietary supercomputer that performs 8.8 billion calculations per second. This enables us to replace visual inspections and periodic pattern inspections with a general-purpose system.
