It is now possible to accurately measure noise in semiconductors, high-density printed circuit boards, components, and modules, which have had many challenges in measurement methods until now.
Features: ★ 1D E-field probe ★ Ultra-small probe head ★ Fiber optic connection ★ Optical power supply – no battery required ★ Wide bandwidth: 500KHz to 3GHz ★ Dynamic range: typ. 130dB (1Hz) ★ Low noise: typ. <10μV/(m×√Hz) @ 200–500MHz typ. <30μV/(m×√Hz) @ 5MHz–3GHz
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basic information
The EFS-105 is a system designed for wideband measurement of electric field strength. Instead of connecting the probe head and base unit with a coaxial cable, it is connected using an analog optical fiber link, allowing it to be used as a compact, wideband active antenna.
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Company information
As a company that provides unique and innovative solutions in EMC testing and general measurement, Wavecrest Corporation is active in this field. The increasingly advanced electronic and communication environment not only affects the performance of its products but also serves as a social infrastructure that impacts the overall safety of society, requiring high safety and reliability. We aim to offer new products and solutions that the market needs, without being constrained by traditional testing methods and equipment.