The high-temperature HDT testing device is a load deflection temperature testing machine that supports tests exceeding 300°C.
By controlling the arrangement of the test specimens and the airflow within the chamber, we significantly improve the temperature distribution.
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basic information
■Number of test specimens: 3 or 6 ■Heat medium: Air ■Test temperature: max. 450°C ■Heating rate: 120°C/h, 50°C/h ■Bending stress: 1.80MPa (Method A), 0.45MPa (Method B) ■Displacement measurement: Differential transformer, displayed in units of 1/1000mm ■Test specimen support table: Distance between supports 64±1mm, 100±1mm (shared) ■Cooling method: Forced cooling using compressed air ■Data processing device: Standard included (PC, data processing software) ■Safety devices: Safety door interlock mechanism (cannot open or close if the temperature inside the test chamber exceeds the set temperature), no load or platform operation when the safety door is open, over-temperature prevention device For other specifications, please refer to the catalog.
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Applications/Examples of results
As the demand for high functionality and high performance of plastics increases, it is possible to conduct load deflection temperature tests exceeding 300°C.
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Company information
Toyo Seiki Seisakusho Co., Ltd. is a comprehensive manufacturer of various material testing machines and environmental testing equipment targeting fields such as plastics, rubber, paints, paper, and textiles. Since its establishment in 1934, we have been dedicated to "testing machines" and have supported our customers' research and development and quality control in various fields. We will continue to refine our technological capabilities and respond to our customers' needs. [Product Development Timeline] 1955: Thermoplastic Resin Fluidity Testing Machine 'Melt Indexer' 1960: Universal Material Testing Machine 'Strograph' 1963: Curing Testing Machine 'Oscillating Disk Rheometer (ODR)' 1970: Mixing and Extrusion Testing Equipment 'Laboplast Mill' 1982: Capillary Rheometer 'Capillograph'
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