A flexible film thickness measurement system that can be combined from spectrometers, software, and microscopes.
The film thickness measurement system proposed by OptoSilus is an original system that combines spectrometers, light sources, reflection probes, etc., from Ocean Optics with spectral interference film thickness measurement software from partner manufacturers.
Inquire About This Product
basic information
From spectrometers to software, the combinations are flexible, allowing us to provide setups tailored to your needs, such as measuring the thickness of fine spots combined with microscopes or real-time measurements of the film formation process. For more detailed information, please refer to the catalog or contact us directly.
Price information
-
Delivery Time
Applications/Examples of results
【Features】 ● Real-time measurement ● Flexible system upgrades from simple configurations to customizations ● Non-contact, does not damage samples ● High cost performance
Company information
Optosirius is a technical trading company that imports and sells spectrometers, measuring instruments, and optical components. Our main product line features compact spectrometers from Ocean Optics, which boasts one of the largest market shares in the world. Additionally, we handle high-brightness LED products, compact Raman measuring instruments, multispectral sensors/multispectral cameras, compact color luminance meters capable of high-speed data acquisition, switches compatible with multimode optical fibers, materials such as quantum dots, and optical components like infrared detectors. A list of manufacturers we represent as authorized import agents, along with detailed information on each manufacturer's products, can be found on our company website.
![[SKYCOM TOUCH Use Cases] Quality Control and Statistical Analysis](https://image.www.ipros.com/public/product/image/e01/2000562628/IPROS82735088268132966104.png?w=280&h=280)
