Introducing the industrial X-ray CT "CA20," ideal for inspection and analysis of next-generation semiconductors!

We are pleased to introduce our new product "CA20," which is specialized in quality inspection and internal structure analysis of next-generation semiconductors.
The CA20 is equipped with cutting-edge industrial X-ray CT technology, enabling high-precision and efficient detection of minute defects and analysis of complex internal structures. It meets the stringent quality requirements faced by the next-generation semiconductor industry and significantly contributes to the optimization of production processes and the improvement of product reliability. We invite you to explore its potential.
Our expert staff will be on-site to answer any questions you may have about the product and technology. Please feel free to stop by.
Event Overview:
• Date: December 11 (Wednesday) to December 13 (Friday), 2024
• Venue: Tokyo Big Sight
• Hall/Booth Number: East Hall 7, Booth 7332
We sincerely look forward to your visit.
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