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We are pleased to introduce our new product "CA20," which is specialized in quality inspection and internal structure analysis of next-generation semiconductors. The CA20 is equipped with cutting-edge industrial X-ray CT technology, enabling high-precision and efficient detection of minute defects and analysis of complex internal structures. It meets the stringent quality requirements faced by the next-generation semiconductor industry and significantly contributes to the optimization of production processes and the improvement of product reliability. We invite you to explore its potential. Our expert staff will be on-site to answer any questions you may have about the product and technology. Please feel free to stop by. Event Overview: • Date: December 11 (Wednesday) to December 13 (Friday), 2024 • Venue: Tokyo Big Sight • Hall/Booth Number: East Hall 7, Booth 7332 We sincerely look forward to your visit.

Check out three simple (and fast!) methods for evaluating porosity using CT with Dragonfly. Each method can be automated using macros, and you can download an application note detailing the methods and the required analysis time. X-ray computed tomography (CT), often conducted as a spot check in foundries, enables a detailed quality assessment of cast products, including the distribution and extent of porosity of particular interest. High throughput is necessary, and therefore, simple and fast 3D image processing methods are essential. This Dragonfly application note presents three simple (and fast!) methods for representative cast products with varying porosity. Each method can be automated using macros, and the application note includes details on the required analysis time.