Notice of Joint Research Report and Seminar Presentation with Ehime University (JPCA Show 2024 / 2024 Microelectronics Show)

Takaya Corporation is conducting joint research with the Graduate School of Science and Engineering at Ehime University on "Accelerating the Inspection of Flying Probe Testers Using Deep Reinforcement Learning."
We are pleased to announce that a report on this research will be displayed and introduced at the Ehime University booth during the JPCA Show 2024 / 2024 Microelectronics Show, which will be held at Tokyo Big Sight from June 12 (Wednesday) to June 14 (Friday), 2024. Additionally, a seminar presentation related to this topic will take place on June 14 (Friday) at the venue. Takaya will also be exhibiting at the same exhibition, showcasing a real Flying Probe Tester.
We hope that all attendees will visit the booth and seminar venue.
*Ehime University Booth
Booth Number: 3B-56 (Academic Plaza)
*Seminar
Date and Time: June 14 (Friday) 13:20-13:40
Venue: Seminar Room E
Session: 3DMID Seminar / Academic Plaza
*Takaya Corporation Booth
Booth Number: 4C-38 (Hall 4 East)


Date and time | Wednesday, Jun 12, 2024 ~ Friday, Jun 14, 2024 10:00 AM ~ 05:00 PM |
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Capital | Tokyo Big Sight |
Entry fee | Free Advance registration is required from the link provided. |
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