Announcement regarding the development of an AI-equipped visual inspection system for ceramic substrates used in power semiconductors by TAIYO.

Defect detection, which has been difficult until now, has become possible with AI integration. We would like to inform you that the detection of hard-to-distinguish defects has become partially possible. Currently, verification has been completed for ceramic substrates for power semiconductors, and we will continue to improve functionality in defect detection and operational aspects.
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