others

アイテス

EstablishmentJanuary 1, 1993
capital3000Ten thousand
number of employees106
addressShiga/Otsu-shi/1-60 Kuribayashi Town
phone077-599-5015
last updated：
アイテスlogo

アイテス List of Catalogs

271～315 item / All 361 items

Displayed results

Failure analysis of electrostatic discharge damaged orange LED.

Product catalog

Contact this catalog

OBIRCH analysis of SiC devices using short-wavelength lasers.

Product catalog

Contact this catalog

Failure analysis of ICs

Product catalog

Contact this catalog

Surface mount electronic component cross-sectional observation service

Product catalog

Contact this catalog

Cross-section polishing service for implementation parts and electronic components.

Product catalog

Contact this catalog

Contract Analysis: Laser Microscope (Observation & Measurement)

Product catalog

Contact this catalog

[Contract Analysis] Laser Microscope (High-Precision 3D Measurement & Color Observation)

Product catalog

Contact this catalog

Cross-section polishing (CP) method for cross-sectional observation service.

Product catalog

Contact this catalog

Example of analysis using the EBSD method

Product catalog

Contact this catalog

Crystal analysis of Cu using the EBSD method.

Product catalog

Contact this catalog

EBSD analysis

Product catalog

Contact this catalog

Crystal analysis by EBSD: Intermetallic compounds in solder joints.

Product catalog

Contact this catalog

Crystal analysis by EBSD BGA

Product catalog

Contact this catalog

[Analysis Example Using EBSD] Steel Plate

Product catalog

Contact this catalog

[Example of analysis using EBSD] High melting point solder

Product catalog

Contact this catalog

[Example of analysis using EBSD] Via

Product catalog

Contact this catalog

[Example of analysis using EBSD] Pipe

Product catalog

Contact this catalog

[Example of Analysis by EBSD] Screw

Product catalog

Contact this catalog

[Analysis Example by EBSD] Chip

Product catalog

Contact this catalog

Observation of temporal changes associated with reliability testing.

Product catalog

Contact this catalog

Depth profile analysis of thin film layers using XPS angle-resolved method.

Product catalog

Contact this catalog

Institute of Chemical Reaction Mechanisms

Product catalog

Contact this catalog

Cross-sectional observation pre-treatment (sample cutting and resin embedding)

Product catalog

Contact this catalog

Cutting process using a wire saw

Product catalog

Contact this catalog

Slice processing using Isomet.

Product catalog

Contact this catalog

Analysis of multilayer materials using micro-Raman spectroscopy

Product catalog

Contact this catalog

GCMS analysis of liquid crystal components

Technical data・examples

Contact this catalog

Analysis of crystallinity in resin materials using micro-Raman spectroscopy.

Product catalog

Contact this catalog

AFM (Atomic Force Microscope)

Product catalog

Contact this catalog

TOF-SIMS analysis of trace contaminants

Technical data・examples

Contact this catalog

TOF-SIMS analysis of organic matter

Technical data・examples

Contact this catalog

TMA (Thermomechanical Analysis)

Product catalog

Contact this catalog

TG-DTA (Thermogravimetric Differential Thermal Analysis)

Product catalog

Contact this catalog

DSC (Differential Scanning Calorimetry)

Product catalog

Contact this catalog

DMA (Dynamic Mechanical Analysis)

Product catalog

Contact this catalog

[Case Study] X-ray Fluoroscopy and CT Examination Equipment

Technical data・examples

Contact this catalog

[Information] Liquid Crystal Materials and Their Analytical Techniques

Other documents

Contact this catalog

X-ray fluoroscopy and CT scanner: Device appearance and main specifications

Technical data・examples

Contact this catalog

X-ray fluoroscopy and CT examination equipment: Examples of combined use of transmission observation and image processing technology.

Technical data・examples

Contact this catalog

MLCC crack X-ray observation

Technical data・examples

Contact this catalog

X-ray fluoroscopy and CT scanner reflow simulator

Product catalog

Contact this catalog

X-ray fluoroscopy and CT examination device: Observation case of a microphone

Technical data・examples

Contact this catalog

X-ray fluoroscopy and CT examination device: Observation case of chip resistors

Technical data・examples

Contact this catalog

X-ray fluoroscopy and CT examination device: Case of LED malfunction observation (X-ray fluoroscopy observation)

Technical data・examples

Contact this catalog

X-ray fluoroscopy and CT examination device: BGA solder crack analysis case study

Technical data・examples

Contact this catalog