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アイテス

EstablishmentJanuary 1, 1993
capital10000Ten thousand
number of employees92
addressShiga/Otsu-shi/1-60 Kuribayashi Town
phone077-599-5015
last updated：
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アイテス List of Catalogs

226～270 item / All 349 items

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EPMA analysis

Technical data・examples

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Detection of trace elements by EPMA.

Technical data・examples

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State analysis using EPMA

Technical data・examples

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[Analysis Example by EBSD] Crab Claw

Technical data・examples

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Observation of cross-sectional processing of CCD camera module.

Technical data・examples

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[Defective Analysis Case] X-ray Observation of AC Adapter

Technical data・examples

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8-inch IC and MEMS foundry services launched.

Product catalog

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[Data] Whisker Analysis using EBSD

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[Data] Analysis examples of low molecular weight organic acids using ion chromatography

Technical data・examples

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Back surface polishing of semiconductors for luminescence analysis

Product catalog

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LED failure analysis

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[Data] Research Institute of Chemical Reaction Mechanisms, Delamination Mechanism of Heterogeneous Material Interfaces 1

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Material evaluation using a ultra-micro hardness tester.

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Example of analysis using EBSD (ceramics)

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Analysis of inorganic compounds using micro-Raman spectroscopy.

Product catalog

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Analysis of metal corrosion using micro-Raman spectroscopy.

Product catalog

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[Data] Research Institute of Chemical Reaction Mechanisms - Case Study on the Causes of Material Discoloration

Other documents

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Defective analysis of LCD panels

Product catalog

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EBSD analysis of flexible printed circuits (FPC)

Product catalog

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Power semiconductor analysis services

Product catalog

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Whisker evaluation

Product catalog

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Narrowing down defective areas using the EBAC (Absorption Current) method.

Product catalog

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Evaluation of membrane quality using EELS analysis method

Product catalog

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Observation of diffusion layers in semiconductors using FIB-SEM.

Product catalog

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LCD panel quality analysis

Product catalog

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Observation of the diffusion layer of SiC MOSFET using LV-SEM and EBIC methods.

Product catalog

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Backside light emission analysis of SiC devices

Product catalog

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Failure analysis of electrostatic discharge damaged orange LED.

Product catalog

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OBIRCH analysis of SiC devices using short-wavelength lasers.

Product catalog

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Failure analysis of ICs

Product catalog

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Surface mount electronic component cross-sectional observation service

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Cross-section polishing service for implementation parts and electronic components.

Product catalog

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Contract Analysis: Laser Microscope (Observation & Measurement)

Product catalog

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[Contract Analysis] Laser Microscope (High-Precision 3D Measurement & Color Observation)

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Cross-section polishing (CP) method for cross-sectional observation service.

Product catalog

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Example of analysis using the EBSD method

Product catalog

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Crystal analysis of Cu using the EBSD method.

Product catalog

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EBSD analysis

Product catalog

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Crystal analysis by EBSD: Intermetallic compounds in solder joints.

Product catalog

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Crystal analysis by EBSD BGA

Product catalog

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[Analysis Example Using EBSD] Steel Plate

Product catalog

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[Example of analysis using EBSD] High melting point solder

Product catalog

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[Example of analysis using EBSD] Via

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[Example of analysis using EBSD] Pipe

Product catalog

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[Example of Analysis by EBSD] Screw

Product catalog

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