ソフトワークス List of Products and Services

The "Cylinder Inner Surface Appearance Inspection Device" is a device that automatically inspects the inner surface of cylindrical objects such as cylinders. It performs automatic visual inspections for scratches, foreign objects, and chips. The inspection is done in about one-tenth of the time previously required. The inspection is conducted with a camera that moves in the XY direction. In addition to image recording, it automatically determines OK/NG for defects based on user-defined threshold settings. 【Features】 - Fully automatic visual inspection for scratches, foreign objects, and chips - Ensures quantification and detection of defects that were impossible to catch with visual inspection - Approximately one-tenth of the previous inspection time - Inspection is conducted with a camera that moves in the XY direction - Compatible with inline systems equipped with loaders and unloaders *For more details, please refer to the PDF document or feel free to contact us.

• Other measuring instruments
• Non-destructive testing

The "Scratch Inspection Device" can accommodate multiple wafers and performs fully automated visual inspections for extremely small scratches, foreign substances, and chips. It is equipped with a laser displacement meter that automatically measures the distance to the workpiece, making it independent of the wafer thickness. In addition to image recording, it automatically determines OK/NG for defects based on user-defined threshold settings. It supports a wide range of applications, including transparent materials, semi-transparent SiC, GaN, GaAs, sapphire, and silicon. 【Features】 ■ Fully automated visual inspection for extremely small scratches, foreign substances, and chips ■ Equipped with a laser displacement meter that automatically measures the distance to the workpiece ■ The standard wafer size is 4 inches, with customization options available for up to 12 inches *For more details, please refer to the PDF document or feel free to contact us.

• Other measuring instruments
• Non-destructive testing

The "Lens Appearance Inspection Device" utilizes a high-speed, high-resolution camera and an innovative lighting system to conduct high-speed, high-precision inspections of small lenses, including those for smartphones. It is also capable of inspecting for foreign objects, scratches, cracks, and more. Samples are manually loaded, and inspections are performed automatically. Compared to traditional microscope visual measurements, it achieves overwhelming high precision and high reproducibility in a short time using a high-precision CMOS camera. Additionally, it can easily accommodate inline inspections. 【Features】 ■ Supports inspections of both individual lenses and modules ■ Capable of inspecting for foreign objects, scratches, cracks, etc. ■ Achieves overwhelming high precision and high reproducibility in a short time with a high-precision CMOS camera ■ Easily accommodates inline inspections *For more details, please refer to the PDF document or feel free to contact us.

• Other measuring instruments
• Non-destructive testing

The "Lens Height Measurement Device" automatically performs three-dimensional measurements of components mounted on a carrier using a high-speed, high-resolution camera and a microscope through lens focal methods. It simultaneously measures the height difference between the lens tip and the substrate. It is capable of measuring the height of lenses formed on the substrate by injection molding. Compared to traditional visual height measurement with a microscope, it achieves overwhelming high precision and high reproducibility in a short time using a high-precision CMOS camera. It can also easily accommodate fully automated inline systems. 【Features】 ■ Short inspection time ■ High-speed analysis ■ Customizable ■ Capable of measuring the height of lenses formed on the substrate by injection molding *For more details, please refer to the PDF document or feel free to contact us.

• Other measuring instruments
• Non-destructive testing

The "EP500" is an electronic projector capable of automatic dimensional measurement of products based on CAD data. Additionally, it allows registration based on CAD data rather than registering products as a master reference. It can measure and determine the quality of products with significant intersections, and it enables efficient registration work. 【Features】 ■ Master registration using CAD database is possible ■ Efficient registration work ■ Automatic measurement is as simple as placing a sample and pressing the measurement button ■ Supports both transmitted and reflected illumination ■ For items where automatic measurement is difficult with reflected illumination, there is also a user-friendly manual measurement function *For more details, please download the PDF or feel free to contact us.

• Other measuring instruments
• Non-destructive testing
• Other analytical equipment

The "Handy AFM" is an atomic force microscope that can be used as a substitute for SEM and high-magnification 3D optical microscopes. It is ultra-compact, measuring 15 cm in both depth and width. The scanning head is available in two types: high-resolution and wide-area, and can be exchanged instantly. 【Features】 ■ Probe replacement can be performed in a few seconds ■ Carbon nanotube probes can also be auto-approached ■ Optional support for a compact automatic stage and fully automatic inline machines *For more details, please download the PDF or feel free to contact us.

• Other measuring instruments
• Non-destructive testing
• Other analytical equipment