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Monitor the crack propagation with the potential difference of the current flowing through the test specimen.
The Crack Growth Monitor CGM-7 is a measuring device developed by Materelect Ltd. (UK) through years of testing research and experience, which monitors crack growth using the alternating current potential drop method (ACPD).
Collecting changes in the surface coatings of metals and alloys under various environmental conditions as continuous measurement data.
CER measures the resistance values of surface films in processes such as the reduction and formation and destruction of oxide films on metal surfaces with adsorbed water and anions, electrochemical uptake of cations, and metal plating. This allows for real-time observation of the process mechanisms themselves and the dependence on reactive substances and inhibitors. It is also possible to measure the semiconductor properties of surface films on metals and alloys at both room temperature and high temperatures. (CorMet Corporation: Finland)
By applying a constant current to the test specimens in various load tests, the voltage that changes in response to the propagation of "cracks" is measured to monitor the "cracks."
The DCM-2, which applies the latest microprocessor technology, is a measuring instrument that monitors the propagation of "cracks" in material testing.
