Inspection Equipment Product List and Ranking from 41 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Jul 16, 2025～Aug 12, 2025
This ranking is based on the number of page views on our site.

Inspection Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Jul 16, 2025～Aug 12, 2025
This ranking is based on the number of page views on our site.

  1. null/null
  2. 首都高技術 Tokyo//Construction Consultant
  3. null/null
  4. 4 つくばテクノロジー Ibaraki//others 本社
  5. 5 大日商事 Tokyo//Trading company/Wholesale
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Inspection Equipment Product ranking

Last Updated： Aggregation Period:Jul 16, 2025～Aug 12, 2025
This ranking is based on the number of page views on our site.

  1. Liquid Inspection Device "LSR-HN1"
  2. Continuous Sound Testing Device "Konkong" 首都高技術
  3. Liquid Inspection Device "LSR-HN1"
  4. Binding Inspection Device "DUO4" ノーム 本社
  5. 4 Wafer Inspection Device 大日商事

Inspection Equipment Product List

46～60 item / All 221 items

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Sound Testing Device 'CHES-PEA II' Rental

Sound Testing Device 'CHES-PEA II' Rental

Collecting and analyzing sound through automatic hammer strikes! Issuing warnings during delamination and cavity detection.

The "CHES-PEA2" is a sound inspection device that collects and analyzes impact sounds through automatic hammer strikes, displaying and recording abnormalities in structures as numerical values. The results of the impact sounds are displayed on a liquid crystal display as three-digit numbers, with the length of the first wave of the impact sound measured in micoseconds (1μs). Simultaneously, an electronic synthesized sound at a frequency reduced to 1/4 of the acquired data is generated for 0.1 seconds, allowing for confirmation of the acquired data through electronic sound. Defective areas are indicated by a three-color LED display and an alarm via a buzzer, depending on the severity. 【Features】 ■ Collects impact sounds through automatic hammer strikes ■ Records data up to a maximum of 7700 points ■ Allows real-time output of recorded data to a computer during measurement ■ Enables confirmation of acquired data through electronic sound *For more details, please feel free to contact us.

  • Measurement and analysis equipment leasing and rental

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X-ray/CT Scanner Comprehensive Catalog

X-ray/CT Scanner Comprehensive Catalog

Equipped with a unique micro-focus X-ray source! A variety of high-precision X-ray/CT systems from Nikon are available.

This catalog is a comprehensive catalog of Nikon's "X-ray/CT inspection equipment" handled by Argographics. We offer a variety of high-precision X-ray/CT devices equipped with our unique micro-focus X-ray source. We provide suitable solutions for quality control, failure analysis, and materials research across various industries, including automotive, aerospace, energy, and electronic components. [Contents] ■ What is industrial micro-focus X-ray/CT? ■ Flexible response to a wide range of inspection applications ■ Micro-focus X-ray source from Nikon Metrology ■ CT inspection ■ X-ray inspection *For more details, please refer to the PDF document or feel free to contact us.

  • Other analytical equipment

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[Inspection Equipment] ECU Intermediate Inspection Device

[Inspection Equipment] ECU Intermediate Inspection Device

Fully automated line for inspecting multiple circuit boards before separation.

Perform ROM writing and function testing on multiple circuit boards (up to 8) before separation. The boards are conveyed on a conveyor for inspection at each stage. Capable of accommodating circuit boards of various sizes.

  • Non-destructive testing

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Leveling Final Inspection Device

Leveling Final Inspection Device

Final inspection device for leveling function.

A mechanism that uses weights for measurement and applies the same load in the forward and depth directions.

  • Non-destructive testing

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Color Discrimination Test Device TFI-001P

Color Discrimination Test Device TFI-001P

Easily achieve flexible inspections like visual checks. Instantly detect products that do not meet shipping standards.

With just one missing ingredient, you could lose valuable trust. With TDI-P's "Color Discrimination Inspection Device," products that do not meet shipping standards are detected instantly. It automatically inspects irregularly shaped missing ingredients, such as the contents of food. After image inspection, it can sort good and defective products and eliminate the defective ones. Inspection can be performed simply by adding cameras, lighting, and sensors to existing production lines. For more details, please contact us or refer to the catalog.

  • others

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High-Performance Appearance Inspection Machine T-1000

High-Performance Appearance Inspection Machine T-1000

The starting point is that it is an inspection that minimizes equipment investment.

Until now, image inspection machines have all been very expensive, using industrial cameras. Nevertheless, the current situation is that the field of view is narrow, and focus cannot be adjusted due to the height of the parts. We focused on this issue and worked on developing software that controls digital cameras available in the general market to the utmost limit. At SG Tech, we propose a low-cost, high-performance solution system.

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Automated image inspection machine

Automated image inspection machine

Thorough checks from both the new automatic inspection machine and human eyes! A high level of skill is required from the staff.

At our company, we conduct rigorous inspections using image inspection machines to detect minute defects that are not visible to the human eye at the point when printing is completed. We perform both transmission and reflection inspections simultaneously. To ensure that all inspection staff can inspect at the same level, we constantly communicate with each other and thoroughly manage quality in the pre-processing stages. Additionally, before shipment, we conduct thorough checks from both automated inspection machines and human eyes. 【Features】 <Intermediate Inspection> ■ Conduct strict inspections by human eyes at the point when printing is completed ■ Constantly communicate among staff to ensure thorough quality management in the pre-processing stages *For more details, please refer to the PDF document or feel free to contact us.

  • others

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Hard Disk Surface Defect Inspection Device - Laser Explorer

Hard Disk Surface Defect Inspection Device - Laser Explorer

Detecting fine surface defects such as scratches and pits on the surface of hard disks.

By irradiating the surface of the hard disk with a high-power laser, we detect fine surface defects such as scratches and pits, classify them by defect type, and display the results. Not only can we detect scratches with high sensitivity through simultaneous irradiation of multiple lasers, but we can also determine the uneven shapes of the defects. Features: - Detection of minute defects using high-power lasers - High scratch detection capability - Discrimination of defect unevenness - Automatic focus for all units - Excellent cost performance - Customization support - Automatic inspection for one cassette - Compatible with transparent glass substrates

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Disk Chipping Inspection Device DSiS-2015

Disk Chipping Inspection Device DSiS-2015

Detecting chipping, dirt, etc. on glass substrates, media surfaces, and edge areas with high speed and high precision.

This is a mass production line inspection device that detects glass substrates, media surfaces, edge chipping, dirt, etc., with high speed and high precision through image analysis captured by a CCD camera. It can automatically sort disks based on pass/fail judgments, and the inspection results can be communicated to and managed by a higher-level system. - Throughput: up to 800 PPH (depending on inspection conditions) - Footprint: Main body: (W) 1380 × (D) 1700 × (H) 2100 mm (W) 1810: including cassette transfer section PC rack: (W) 570 × (D) 630 × (H) 1850 mm - Cleanliness: Class 10 (at 0.1μm) - Compatible with automatic transport systems Inspection specifications: - Supported disks: 1.89”, 2.5”, 3.5” - Inspection area: entire area excluding the inner peripheral end face (or designated area) - Sensor element size: 7μm - Pixel resolution: inspection area (dependent on lens magnification) - Lens magnification: 1x to 3x (designed according to inspection content) - Design example: 2.5” disk, 800 PPH Inspection area: Inner circumference: R10.0 to R15.0 (2x) Outer circumference: R31.0 to R32.5 (3x)

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Laser-type wafer surface defect inspection device - Laser Explorer

Laser-type wafer surface defect inspection device - Laser Explorer

Transparent wafers also undergo high-speed inspection! High-output lasers detect tiny scratches and particles!

The "Laser Explorer" is the latest wafer surface defect inspection device that also supports transparent wafers. A high-power laser detects minute defects such as scratches, pits, and particles! It can be utilized for shipping and receiving inspections of wafers, as well as for quality control in the epitaxial process! 【Other Features】 ■ High throughput (inspects 25 wafers in a cassette in about 40 minutes) ■ Discriminates the unevenness of defects ■ Automatic focusing for all samples ■ Customization support ■ Automatic inspection for one cassette ■ High-precision marking for defects (optional) ■ Defect review using a laser microscope (optional)

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Precious metal analyzer / gold ingot and coin inspection device

Precious metal analyzer / gold ingot and coin inspection device

For authenticity verification and quality control of precious metals! Non-destructive, quick, and accurate measurement is possible.

We handle measuring instruments that can quickly and non-destructively determine the authenticity of precious metals manufactured by FISCHER. The "SIGMASCOPE GOLD" measuring instrument measures gold ingots and coins based on their electrical conductivity. This is possible because the conductivity differs between pure gold and alloys. The "X-RAY XAN series" analysis device can accurately analyze the composition contained in precious metals using fluorescent X-rays. In addition, we offer a wide range of products to meet various customer needs. 【Features】 ■ SIGMASCOPE GOLD B - Measures the conductivity of gold ingots up to approximately 18mm thick - Determines whether it is pure gold or an alloy - Allows selection of three measurement ranges based on the penetration depth of the gold ingot *For more details, please refer to the PDF document or feel free to contact us.

  • Other analytical equipment
  • Other measuring instruments
  • Non-destructive testing

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