High-precision measurement of metal films (such as copper foil and plating on printed circuit boards) on insulators in a short time (0.7 seconds).
● Adopts a 4-probe (Kelvin type) measurement method. It can measure without being affected by the backside or inner layers, allowing for measurements on double-sided and multilayer substrates without interference from the backside or inner layers.
● Uses a PC. The screen is large and easy to read.
● Calibration and measurement are simple. Two range options are available, allowing for the measurement of metal films from 2 to 120 μm.
● Up to 40 channels can be registered, enabling management by separating channels with user names or part numbers.
● Measurement data can be saved by channel, and statistical items can be set for statistical processing of the measurement data later.
● Abnormal values are notified by setting upper and lower limits for film thickness.