Low cost, high precision, accurate non-destructive testing from 50,000 yen per sample.
Starting from 50,000 yen (excluding tax) per sample
*Sample transportation costs (generally, the customer is responsible for sample transportation expenses)
【Measurement Contents】
Defect - Pore Analysis
Dimensional Measurement
*For other measurement contents, please inquire.
【Delivery Data】
Measurement Report + Original Report Image + Defect Statistics Table
【CT Scanner Specifications】
Model Name: General Micro/Nano CT System diondo d2
Reflection Target X-ray Tube: 190-300kV
Transmission Target X-ray Tube: 160-300kV
Area Array Detector: 3000 × 3000px, 139μm
Focal Length Range: 400-1200mm, adjustable
Maximum Effective Detection Range: Ø520×H650mm
Maximum Load Capacity: 50kg
diControl Software Features: DR Function, Spiral CT, Angle Limited Scan, High-Speed CT, High-Speed Reconstruction GPU Acceleration, Beam Hardening Correction, Artifact Correction, Batch Auto Detection, Automatic Geometry Correction, Daily Detection, Status Detection, Measurement Module VDI/VDE 2630
【Inquiries & Estimates】
Email: info@nd-seiko.co.jp
Phone: 0538-84-9600