Analysis Equipment Product List and Ranking from 18 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Oct 01, 2025～Oct 28, 2025
This ranking is based on the number of page views on our site.

Analysis Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Oct 01, 2025～Oct 28, 2025
This ranking is based on the number of page views on our site.

  1. 日本カンタム・デザイン Tokyo//Government
  2. アイテス Shiga//others
  3. ダイプラ・ウィンテス 本社 Saitama//others
  4. マイクロトラック・ベル Osaka//others
  5. 5 フォトテクニカ Saitama//others
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Analysis Equipment Product ranking

Last Updated： Aggregation Period:Oct 01, 2025～Oct 28, 2025
This ranking is based on the number of page views on our site.

  1. Nanoparticle analysis device NanoSight 日本カンタム・デザイン
  2. Example of analysis using EBSD: Silicon wafer アイテス
  3. Surface and Interface Physical Property Analysis Device 'SAICAS EN・NN' ダイプラ・ウィンテス 本社
  4. Comprehensive Product Catalog "Front Runner in Powder and Granular Material Property Evaluation" マイクロトラック・ベル
  5. 4 Demo/Analysis Now Accepting Particle Analysis Device 'CAMSIZER P4' マイクロトラック・ベル

Analysis Equipment Product List

16～30 item / All 41 items

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VAM analysis device

VAM analysis device

The loaded data can be analyzed using analysis software for conditional searches and trigger searches, which helps reduce analysis time.

We would like to introduce the "VAM Analysis Device," which allows for reading and data analysis of memory data from the Information Memory (VAM)/VAM32/VAM32II. The I/F unit used for reading the Information Memory (VAM) has been significantly compacted compared to the conventional Information Memory (VAM) reader (SD42243-01), making it even easier to carry. Our company leverages the technology developed for selecting LEDs and circuit board layout in railway signal and display devices for development design and manufacturing (prototype mass production). We can solve your problems such as "I want this type of alarm" or "Can you make something like this with LEDs?" so please feel free to contact us. 【Features】 ■ The power supply for the I/F unit is provided by the computer, so no separate AC power supply is needed. ■ The read data can be analyzed using software for conditional searches and trigger searches, which helps reduce analysis time. ■ The contents of the data and search results can be saved in CSV file format. *For more details, please download the PDF or feel free to contact us.

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Non-destructive sound analysis device "NEW EVOTIS"

Non-destructive sound analysis device "NEW EVOTIS"

A waveform acquisition display and waveform analysis device equipped with both impact force inspection and acoustic inspection functions.

The "NEW EVOTIS" is a non-destructive impact sound analysis device that allows for various customizations. This product is primarily intended for research and development purposes, such as human-based waveform feature extraction and parameter setting considerations. However, it also enables on-site judgment of quality while observing waveforms (with LED display and alarm buzzer on the panel surface). Please feel free to contact us if you have any requests. 【Features】 ■ Equipped with an acoustic microphone near the impact hammer to capture the waveform of the impact force and the acoustic waveform from the microphone. ■ The acquired waveforms are transferred to a computer and displayed on the same screen. ■ Waveforms can be displayed in real-time and stored within the computer, with retrieved data capable of being overlaid on the computer screen in up to eight different colors. *For more details, please download the PDF or feel free to contact us.

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Demo/Analysis Now Available - Particle Analysis Device 'CAMSIZER M1'

Demo/Analysis Now Available - Particle Analysis Device 'CAMSIZER M1'

Analysis of particle size and shape characteristics using static image analysis! High-quality and detailed particle images can be obtained.

The "CAMSIZER M1" is a static image analysis device that measures particle size and shape in the range of 0.5μm to 1500μm based on the measurement principle of static image analysis. It is based on a microscope system compliant with static image analysis ISO13322-1, equipped with optimized hardware for automation and user-friendly software. Samples are dispersed and fixed on a slide glass or other carriers, and while stepping with an automatic sample stage, images are captured in stages using an 18.1-megapixel camera. Since the particles are stationary during imaging, detailed and high-quality particle images can be obtained. 【Features】 ■ High-resolution static image analysis 　・ (ISO 13322-1) 0.5 μm to 1500μm ■ 18.1 megapixel color camera ■ Up to 6 types of objective lenses ■ Precise analysis of fine particles ■ Excellent image quality *For more details, please refer to the PDF document or feel free to contact us.

  • Other analytical equipment

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Ultra-compact spectral phase and intensity measurement analysis device (LX-SPIDER)

Ultra-compact spectral phase and intensity measurement analysis device (LX-SPIDER)

Smaller than a laptop and portable anywhere, easy alignment with automatic calibration feature.

The LX-SPIDER is a device that uses the SPIDER method for phase and intensity measurement of ultra-fast lasers, enabling single-shot measurements and real-time phase measurement and analysis. It is ultra-compact, easy to align, and equipped with an automatic calibration function. Features: ● Wavelength range: 750~900nm ● Pulse width: Optical set 1... 16~150fs Optical set 2... 70~300fs ● Measures spectral phase, intensity, and temporal intensity of Ti:Sa lasers to check performance ● Single-shot measurement ● Real-time analysis ● Equipped with automatic calibration function, no adjustment required upon delivery

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Nanoparticle analysis device NanoSight

Nanoparticle analysis device NanoSight

Optimal for measuring the particle size and number concentration distribution of exosomes (extracellular vesicles / EVs) and ultrafine bubbles (nano-sized bubbles / UFB)!

The new model, NanoSight Pro, was released in September 2023, transitioning from the NS300! Please take a look at the product details! For information on NanoSight Pro, click here: Ipros site: https://www.ipros.jp/product/detail/2001025622 NanoSight allows real-time observation of the Brownian motion of nanoparticles in liquid on a PC screen using NTA (Nanoparticle Tracking Analysis) technology. By analyzing the Brownian motion of the particles, you can obtain graphs of particle size and number concentration distribution.

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Efficiently evaluate the performance of spray nozzles through contracted analysis, leading to problem-solving!

Efficiently evaluate the performance of spray nozzles through contracted analysis, leading to problem-solving!

We present materials that visualize the performance of spray nozzles through analyses related to nozzle performance, such as fluid analysis, particle size measurement, and collision force distribution, along with examples of analysis and evaluation.

The performance of spray nozzles is influenced by factors such as pressure, flow rate, spray pattern, particle size, flow velocity, flow distribution, and impact force distribution. Everloy possesses the measurement equipment and analytical evaluation techniques for these factors and has conducted numerous analyses to date. Based on years of accumulated experiments and analytical evaluations, we can propose optimization plans for spray nozzles tailored to our customers' intended use. Customers in need of analysis are welcome to consult us freely.

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[Example of Analysis by EBSD] Chip

[Example of Analysis by EBSD] Chip

I will introduce an example of analysis using EBSD where orientation was observed in the Al wiring.

We will introduce an example of analysis of chip surface wiring (Al) using EBSD. The package resin was opened using a chemical solution/RIE, and an analysis of the Al pattern on the chip surface was conducted using EBSD. As a result, orientation was observed in the Al wiring. The normal orientation is distributed, suggesting the presence of many crystals. 【Overview】 ■ Analysis Method - The package resin was opened using a chemical solution/RIE. - An analysis of the Al pattern on the chip surface was conducted using EBSD. ■ Results - Orientation was observed in the Al wiring. *For more details, please refer to the PDF document or feel free to contact us.

  • Electrical Equipment Testing
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[Example of analysis using EBSD] Via

[Example of analysis using EBSD] Via

The EBSD method allows for the estimation of crystal size distribution and residual stress.

We will introduce an example of analysis using EBSD for vias (Cu) formed in laminated substrates. The EBSD method allows for the estimation of crystal size distribution and residual stress. Additionally, by highlighting on the map, the features that appear in the graph can be visualized. [Overview] ■Observation of crystal structure using EBSD ・IPF map ・GROD map ・Crystal grain distribution map *For more details, please refer to the PDF document or feel free to contact us.

  • Electrical Equipment Testing
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Example of analysis using EBSD (ceramics)

Example of analysis using EBSD (ceramics)

Examples of analysis using EBSD will be introduced, such as 'Observation/Elemental Analysis' and 'Analysis by EBSD'!

We will introduce an example of analysis using EBSD for ceramic (Al2O3). In the "Observation/Elemental Analysis," it was determined to be Al2O3 based on elemental analysis using EDX, and it was observed that Si was scattered as shown in the map. In the "Analysis using EBSD," the distribution of crystal size and orientation can be confirmed using the EBSD method, and by highlighting on the map, the features that appeared in the graph can be visualized. [Analysis Overview] ■ Observation/Elemental Analysis - Observation using SEM and elemental analysis using EDX ■ Analysis using EBSD - Observation of crystal structure using EBSD *For more details, please refer to the PDF document or feel free to contact us.

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[Data] Whisker Analysis by EBSD

[Data] Whisker Analysis by EBSD

Introducing a case study analyzing whiskers that occurred on the lead terminals of an IC package!

This document introduces a case study on whiskers that occurred on the lead terminals of IC packages, where cross-sections were created through mechanical polishing, followed by SEM observation and EBSD analysis. It includes surface SEM images of the IC package as well as cross-sectional SEM images. It is evident that the crystal grains and grain boundaries measured by the EBSD method are consistent. We invite you to read it. 【Published Case Studies】 ■Observation/Cross-section preparation ■Analysis using EBSD *For more details, please refer to the PDF document or feel free to contact us.

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Crystal analysis by EBSD: Aluminum weld joint (spot welding)

Crystal analysis by EBSD: Aluminum weld joint (spot welding)

We will introduce an analysis example confirming that the welded area has a large distribution of grain crystals.

As an example of EBSD, we conducted an analysis of the cross-section of an aluminum welding joint from the cross-sectional direction, and we would like to introduce it. For a sample where an aluminum plate was spot-welded to an aluminum case, we prepared a cross-section of the weld and performed EBSD analysis. In the distribution of grain sizes, it was confirmed that the weld area has a larger number of large grains compared to the base material. [Analysis Overview] ■ Visualization of Grain Structure - It can be seen that the shape and size of the grains in the weld area differ from those in the base material. ■ Distribution of Grain Sizes - It is confirmed that the weld area has a greater distribution of large grains compared to the base material. *For more details, please refer to the PDF document or feel free to contact us.

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Example of analysis using EBSD: Silicon wafer

Example of analysis using EBSD: Silicon wafer

The measured silicon wafer is single crystal! The IPF map, pole figure, and inverse pole figure resulted in relatively simple outcomes.

Here is a case study of a silicon wafer analyzed using EBSD. A small piece was cut from the wafer, and an IPF map was obtained for a central area of 50×50 μm. The measurement area shows red, indicating the {001} plane, and the absence of grain boundaries confirms that it is a single crystal. Since the measured silicon wafer is a single crystal, the IPF map, pole figure, and inverse pole figure resulted in relatively simple outcomes. *For more details, please refer to the PDF document or feel free to contact us.*

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  • Electrical Equipment Testing

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What is motion capture? - Three-dimensional motion analysis device -

What is motion capture? - Three-dimensional motion analysis device -

Quantifying people and things

What is a three-dimensional motion measurement device/motion capture? We introduce everything from the principles of motion capture to the features of the Qualisys system. □ What is motion capture? The principles of the Qualisys motion capture system. https://archivetips.com/qualisys/mocap-knowhow

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