Analysis Equipment Product List and Ranking from 16 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Nov 19, 2025～Dec 16, 2025
This ranking is based on the number of page views on our site.

Analysis Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Nov 19, 2025～Dec 16, 2025
This ranking is based on the number of page views on our site.

  1. 東邦電機工業 本社　相模工場　営業所（北海道・東北・東京・名古屋・大阪・四国・九州） Kanagawa//Building materials, supplies and fixtures manufacturers
  2. 日本カンタム・デザイン Tokyo//Government
  3. アーカイブティップス 本社 Tokyo//Trading company/Wholesale
  4. 4 フォトテクニカ Saitama//others
  5. 5 デルフトハイテック Kanagawa//Trading company/Wholesale
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Analysis Equipment Product ranking

Last Updated： Aggregation Period:Nov 19, 2025～Dec 16, 2025
This ranking is based on the number of page views on our site.

  1. VAM analysis device 東邦電機工業 本社　相模工場　営業所（北海道・東北・東京・名古屋・大阪・四国・九州）
  2. Nanoparticle analysis device NanoSight 日本カンタム・デザイン
  3. 1,400fps high sampling motion analysis system Qualisys アーカイブティップス 本社
  4. 4 VAM Analysis Device <iOS Compatible Version> 東邦電機工業 本社　相模工場　営業所（北海道・東北・東京・名古屋・大阪・四国・九州）
  5. 5 OLE デルフトハイテック

Analysis Equipment Product List

16～30 item / All 33 items

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Nanoparticle analysis device NanoSight

Nanoparticle analysis device NanoSight

Optimal for measuring the particle size and number concentration distribution of exosomes (extracellular vesicles / EVs) and ultrafine bubbles (nano-sized bubbles / UFB)!

The new model, NanoSight Pro, was released in September 2023, transitioning from the NS300! Please take a look at the product details! For information on NanoSight Pro, click here: Ipros site: https://www.ipros.jp/product/detail/2001025622 NanoSight allows real-time observation of the Brownian motion of nanoparticles in liquid on a PC screen using NTA (Nanoparticle Tracking Analysis) technology. By analyzing the Brownian motion of the particles, you can obtain graphs of particle size and number concentration distribution.

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Efficiently evaluate the performance of spray nozzles through contracted analysis, leading to problem-solving!

Efficiently evaluate the performance of spray nozzles through contracted analysis, leading to problem-solving!

We present materials that visualize the performance of spray nozzles through analyses related to nozzle performance, such as fluid analysis, particle size measurement, and collision force distribution, along with examples of analysis and evaluation.

The performance of spray nozzles is influenced by factors such as pressure, flow rate, spray pattern, particle size, flow velocity, flow distribution, and impact force distribution. Everloy possesses the measurement equipment and analytical evaluation techniques for these factors and has conducted numerous analyses to date. Based on years of accumulated experiments and analytical evaluations, we can propose optimization plans for spray nozzles tailored to our customers' intended use. Customers in need of analysis are welcome to consult us freely.

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[Example of Analysis by EBSD] Chip

[Example of Analysis by EBSD] Chip

I will introduce an example of analysis using EBSD where orientation was observed in the Al wiring.

We will introduce an example of analysis of chip surface wiring (Al) using EBSD. The package resin was opened using a chemical solution/RIE, and an analysis of the Al pattern on the chip surface was conducted using EBSD. As a result, orientation was observed in the Al wiring. The normal orientation is distributed, suggesting the presence of many crystals. 【Overview】 ■ Analysis Method - The package resin was opened using a chemical solution/RIE. - An analysis of the Al pattern on the chip surface was conducted using EBSD. ■ Results - Orientation was observed in the Al wiring. *For more details, please refer to the PDF document or feel free to contact us.

  • Electrical Equipment Testing
  • Other analytical equipment

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[Example of analysis using EBSD] Via

[Example of analysis using EBSD] Via

The EBSD method allows for the estimation of crystal size distribution and residual stress.

We will introduce an example of analysis using EBSD for vias (Cu) formed in laminated substrates. The EBSD method allows for the estimation of crystal size distribution and residual stress. Additionally, by highlighting on the map, the features that appear in the graph can be visualized. [Overview] ■Observation of crystal structure using EBSD ・IPF map ・GROD map ・Crystal grain distribution map *For more details, please refer to the PDF document or feel free to contact us.

  • Electrical Equipment Testing
  • Other analytical equipment

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Example of analysis using EBSD (ceramics)

Example of analysis using EBSD (ceramics)

Examples of analysis using EBSD will be introduced, such as 'Observation/Elemental Analysis' and 'Analysis by EBSD'!

We will introduce an example of analysis using EBSD for ceramic (Al2O3). In the "Observation/Elemental Analysis," it was determined to be Al2O3 based on elemental analysis using EDX, and it was observed that Si was scattered as shown in the map. In the "Analysis using EBSD," the distribution of crystal size and orientation can be confirmed using the EBSD method, and by highlighting on the map, the features that appeared in the graph can be visualized. [Analysis Overview] ■ Observation/Elemental Analysis - Observation using SEM and elemental analysis using EDX ■ Analysis using EBSD - Observation of crystal structure using EBSD *For more details, please refer to the PDF document or feel free to contact us.

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[Data] Whisker Analysis by EBSD

[Data] Whisker Analysis by EBSD

Introducing a case study analyzing whiskers that occurred on the lead terminals of an IC package!

This document introduces a case study on whiskers that occurred on the lead terminals of IC packages, where cross-sections were created through mechanical polishing, followed by SEM observation and EBSD analysis. It includes surface SEM images of the IC package as well as cross-sectional SEM images. It is evident that the crystal grains and grain boundaries measured by the EBSD method are consistent. We invite you to read it. 【Published Case Studies】 ■Observation/Cross-section preparation ■Analysis using EBSD *For more details, please refer to the PDF document or feel free to contact us.

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Crystal analysis by EBSD: Aluminum weld joint (spot welding)

Crystal analysis by EBSD: Aluminum weld joint (spot welding)

We will introduce an analysis example confirming that the welded area has a large distribution of grain crystals.

As an example of EBSD, we conducted an analysis of the cross-section of an aluminum welding joint from the cross-sectional direction, and we would like to introduce it. For a sample where an aluminum plate was spot-welded to an aluminum case, we prepared a cross-section of the weld and performed EBSD analysis. In the distribution of grain sizes, it was confirmed that the weld area has a larger number of large grains compared to the base material. [Analysis Overview] ■ Visualization of Grain Structure - It can be seen that the shape and size of the grains in the weld area differ from those in the base material. ■ Distribution of Grain Sizes - It is confirmed that the weld area has a greater distribution of large grains compared to the base material. *For more details, please refer to the PDF document or feel free to contact us.

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Example of analysis using EBSD: Silicon wafer

Example of analysis using EBSD: Silicon wafer

The measured silicon wafer is single crystal! The IPF map, pole figure, and inverse pole figure resulted in relatively simple outcomes.

Here is a case study of a silicon wafer analyzed using EBSD. A small piece was cut from the wafer, and an IPF map was obtained for a central area of 50×50 μm. The measurement area shows red, indicating the {001} plane, and the absence of grain boundaries confirms that it is a single crystal. Since the measured silicon wafer is a single crystal, the IPF map, pole figure, and inverse pole figure resulted in relatively simple outcomes. *For more details, please refer to the PDF document or feel free to contact us.*

  • Other analytical equipment
  • Electrical Equipment Testing

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What is motion capture? - Three-dimensional motion analysis device -

What is motion capture? - Three-dimensional motion analysis device -

Quantifying people and things

What is a three-dimensional motion measurement device/motion capture? We introduce everything from the principles of motion capture to the features of the Qualisys system. □ What is motion capture? The principles of the Qualisys motion capture system. https://archivetips.com/qualisys/mocap-knowhow

  • Other measuring instruments
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Multi-function analysis device "DAB8000 mini series"

Multi-function analysis device "DAB8000 mini series"

U-SDI standard update support! We provide seamless monitoring by minimizing processing delays.

The "DAB8000 mini series" is an all-in-one analysis device for the development of 8K equipment that fully supports the UHDTV (BT.2020) standard. With a UHDTV-compatible waveform monitor, it allows for real-time analysis and the simultaneous confirmation of multiple waveforms. By minimizing processing delays through dedicated hardware analysis, it provides seamless monitoring. 【Features】 ■ For video ■ All-in-one ■ Fully supports UHDTV (BT.2020) standard ■ Compatible with U-SDI standard updates ■ Real-time analysis with the ability to confirm multiple waveforms simultaneously *For more details, please refer to the PDF document or feel free to contact us.

  • Audio and video equipment

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VAM Analysis Device <iOS Compatible Version>

VAM Analysis Device <iOS Compatible Version>

In addition to reading VAM data, settings and monitoring are possible! The read data can be sent via email and analyzed on a PC.

We would like to introduce our iOS-compatible "VAM Analysis Device." By connecting this device, you can analyze the VAM and VAM32 series using an iPad. The connection is made through the interface unit, and communication between the iPad and the interface unit is done via Bluetooth (BLE). Our company utilizes the technology developed through our experience with signal and display devices for railways to select LEDs and design circuit layouts, enabling us to carry out development design and manufacturing (prototype and mass production). We can solve your problems, such as "I want this type of alarm" or "Can you create something like this with LEDs?" so please feel free to contact us. 【Features】 ■ Analysis of VAM and VAM32 series using an iPad ■ Ability to read VAM data, as well as settings and monitoring ■ The read VAM data can be sent via email and analyzed on a computer in the office *For more details, please download the PDF or feel free to contact us.

  • Other Management Services

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Waveform Analysis Device (General-purpose 4-channel MCA)

Waveform Analysis Device (General-purpose 4-channel MCA)

All measurement conditions, including high voltage bias and gain, can be set using the included control software!

We would like to introduce the "Waveform Analysis Device (General-purpose 4ch MCA)" handled by ANSeeN Co., Ltd. By measuring the peak value and edge time (rise time) or decay time, waveform discrimination is possible. Simultaneous measurement across all channels is possible, and by equipping an optional dedicated IP, coincidence measurement and correlation measurement can also be performed. 【Features】 ■ Equipped with waveform discrimination function ■ High-voltage power supply included ■ 4-channel simultaneous measurement ■ Highly user-friendly digital control *For more details, please download the PDF or feel free to contact us.

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Waveform analysis device "conandesse"

Waveform analysis device "conandesse"

Predictive maintenance using IoT! Visualizing machine anomalies.

"Conandesse" is a device that can detect abnormalities in machinery in advance by analyzing and judging the current and vibrations emitted by the machine through waveform analysis. The operation is simple, using three buttons in a browser for "Condition Setting," "Measurement," and "Judgment." It can be used to monitor various machines such as machining centers and industrial robots. 【Features】 ■ Compact and low-cost ■ Customizable ■ Winner of the 26th Reader's Choice Naming Award "Idea Naming Award" in the Nikkan Kogyo Shimbun in 2015 *For more details, please download the PDF or feel free to contact us.

  • Vibration and Sound Level Meter
  • Other measuring instruments
  • Monitoring and Control Equipment

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