Basis of laser diffraction and scattering devices.
G. Mie successfully handled the diffraction of plane monochromatic waves by uniform spheres of arbitrary diameter and material, which exist in a homogeneous medium, using electromagnetism in 1908, obtaining an exact solution. This scattering phenomenon is very important to us. The significance of Mie scattering lies in the fact that a considerable portion of the measurement range of the particle size distribution measurement devices we are dealing with falls within this category. However, mathematically solving Mie's scattering presents very challenging elements. Although programs have already been developed to solve Mie's equations using computers, it remains a difficult task, and how to overcome this problem becomes the know-how of particle size distribution measurement device manufacturers. *For more details, please refer to the related links or feel free to contact us.*
Inquire About This Product
basic information
For more details, please refer to the related links or feel free to contact us.
Price range
Delivery Time
Applications/Examples of results
For more details, please refer to the related links or feel free to contact us.
catalog(4)
Download All CatalogsCompany information
We are a comprehensive manufacturer of powder and particle property measurement equipment. As professionals in "powder and particles," we consistently provide leading technology and services in the industry.