The measurement time is approximately 5 to 20 seconds per measurement! Non-destructive and highly reliable analysis can be performed quickly.
"Innov-X" is an energy-dispersive portable X-ray fluorescence analyzer that allows for on-site analysis without damaging the material, enabling non-destructive and rapid identification of the elemental composition of materials. The measurement time is approximately 5 to 20 seconds per measurement, and results can be obtained within a few seconds, with measurement data saved to a pocket PC. The analysis employs the Fundamental Parameter (FP) method, eliminating the need for standard samples. 【Features】 ■ Enables rapid and highly reliable analysis without destruction ■ Compact and lightweight with battery power, allowing for on-site analysis ■ Utilizes the Fundamental Parameter (FP) method for analysis ■ Does not require standard samples ■ Measurement time is approximately 5 to 20 seconds per measurement *For more details, please refer to the PDF document or feel free to contact us.
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【Specifications】 ■Measured elements: Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Hf, etc. ■X-ray tube: Tube voltage 10–35kV, tube current 5–50μA ■Detector: Si Pin diode, FWHM 250eV or less at 5.90keV ■Power supply: Li-ion battery ■Alloy library: Standard 300 types (additional types available) ■Control unit: HP Pocket PC ■Weight and dimensions: 1.8kg, approximately 320×270×100mm *For more details, please refer to the PDF document or feel free to contact us.
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【Purpose】 ■Analysis of alloy components (identification of elements and measurement of content) *For more details, please refer to the PDF document or feel free to contact us.*
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At Japan Non-Destructive Testing Co., Ltd., we conduct various inspections and equipment diagnostics for industrial plants and other facilities, as well as heat treatment such as stress relief for welds. Our company possesses technologies such as "Radiographic Testing (RT)" and "Ultrasonic Testing (UT)." When you require non-destructive testing, please feel free to entrust it to us.
