Demo/Analysis Now Available! Dynamic Light Scattering! Advanced technologies such as the heterodyne method and frequency analysis method have been adopted as measurement principles.
In the expanding world of nanotechnology, the "NANOTRAC WAVE II" has been developed as an evolution of the well-regarded UPA series that has been trusted by our customers. It employs advanced technologies such as the heterodyne method and frequency analysis as its measurement principles. Achieving a wide range of concentration measurements with high precision and high resolution, we deliver the hidden potential of nanotechnology to our customers through the technical expertise and quality cultivated over many years of experience. 【Features】 ■ Measurement principle (Dynamic Light Scattering: DLS) ■ Stable data from low to high concentrations ■ Adoption of the heterodyne method ■ Background measurement ■ Use of a unique frequency analysis algorithm *For more details, please refer to the PDF document or feel free to contact us.
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【Product Lineup】 ■ Particle size measurement - Wide concentration range ・ NANOTRAC WAVE II EX150 ■ Particle size measurement and zeta potential measurement all-in-one model ・ NANOTRAC WAVE II UZ152 ■ Particle size measurement - Model suitable for single nanometer and ultra-low concentration samples ・ NANOTRAC WAVE II UT151 ■ Model compatible with resin and glass cuvette cells ・ NANOTRAC WAVE II Q ■ Particle size measurement external probe model ・ NANOTRAC FLEX * For more details, please refer to the PDF document or feel free to contact us.
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For more details, please refer to the PDF document or feel free to contact us.
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We are a comprehensive manufacturer of powder and particle property measurement equipment. As professionals in "powder and particles," we consistently provide leading technology and services in the industry.