[X-ray fluoroscopy and CT examination device] Case of LED malfunction observation (X-ray fluoroscopy observation)
[Video Available] Captured the moment of defect occurrence! Here we introduce a case of LED X-ray observation.
We would like to introduce a case where the moment a surface-mounted LED is damaged due to overload was captured through X-ray observation. In this case, the surface-mounted LED was powered on, and the voltage and current were gradually increased from the rated values until it became non-functional due to overload. This process was recorded. Additionally, you can view the process of it becoming non-functional in a video. 【LED Failure Observation Case】 ■ After becoming non-functional - Melting, disconnection - Change in the loop shape of the wire - Delamination of the phosphor - Changes in the shape and size of voids *For more details, please refer to the PDF document or feel free to contact us.
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For more details, please refer to the PDF document or feel free to contact us.
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【Usage】 ■ X-ray fluoroscopy and CT examination equipment *For more details, please refer to the PDF document or feel free to contact us.
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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.
